SEMICONDUCTOR DEVICE
PURPOSE:To increase the cut off frequency of a semiconductor device by providing two holes on a substrate, and deleting a P-N junction region having larger capacity of insulator of non-active regions as much as possible, thereby reducing the effective capacity. CONSTITUTION:An oxidized film 2 and a...
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Format | Patent |
Language | English |
Published |
11.09.1982
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Abstract | PURPOSE:To increase the cut off frequency of a semiconductor device by providing two holes on a substrate, and deleting a P-N junction region having larger capacity of insulator of non-active regions as much as possible, thereby reducing the effective capacity. CONSTITUTION:An oxidized film 2 and a polysilicon 17a are formed on a P type semiconductor substrate 1, and two holes are opened by photolithography. In this case, the film 2 is etched excessively, and then ions are implanted in the film, and an N<+> type layer 3 becoming a collector is formed. Then, a polysilicon 17b is again deposited, and a thick oxidized film 18 is formed by dry etching. Subsequently, the film 18 and the polysilicon 17 are selectively etched, the polysilicon 17c is further selectively deposited. Then, the layer 3 is covered with resist, boron ions are implanted so that a P type layer 10 is connected in the substrate, and a channel cut 7 is formed. Similarly, the emitter 12 is formed, and base and collector electrodes 14, 16 are then formed. |
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AbstractList | PURPOSE:To increase the cut off frequency of a semiconductor device by providing two holes on a substrate, and deleting a P-N junction region having larger capacity of insulator of non-active regions as much as possible, thereby reducing the effective capacity. CONSTITUTION:An oxidized film 2 and a polysilicon 17a are formed on a P type semiconductor substrate 1, and two holes are opened by photolithography. In this case, the film 2 is etched excessively, and then ions are implanted in the film, and an N<+> type layer 3 becoming a collector is formed. Then, a polysilicon 17b is again deposited, and a thick oxidized film 18 is formed by dry etching. Subsequently, the film 18 and the polysilicon 17 are selectively etched, the polysilicon 17c is further selectively deposited. Then, the layer 3 is covered with resist, boron ions are implanted so that a P type layer 10 is connected in the substrate, and a channel cut 7 is formed. Similarly, the emitter 12 is formed, and base and collector electrodes 14, 16 are then formed. |
Author | SAKURAI HIROMI |
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Notes | Application Number: JP19810032982 |
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PublicationDecade | 1980 |
PublicationYear | 1982 |
RelatedCompanies | MITSUBISHI DENKI KK |
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Snippet | PURPOSE:To increase the cut off frequency of a semiconductor device by providing two holes on a substrate, and deleting a P-N junction region having larger... |
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SubjectTerms | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY SEMICONDUCTOR DEVICES |
Title | SEMICONDUCTOR DEVICE |
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