METHOD OF ANALYZING PATTERN

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Main Authors	SAKATA TOSHIBUMI, KAJIURA TOSHIHIRO, MORI MASAHIRO, SHIMODA AKIHISA, MASAKI SENYOU
Format	Patent
Language	English
Published	12.02.1977
Subjects	APPARATUS SPECIALLY ADAPTED THEREFOR BRAIDING CALCULATING CINEMATOGRAPHY COLORIMETRY COMPUTING COUNTING DESIGNING PATTERNS ELECTRIC COMMUNICATION TECHNIQUE ELECTRIC DIGITAL DATA PROCESSING ELECTRICITY ELECTROGRAPHY HOLOGRAPHY KNITTING LACE-MAKING MATERIALS THEREFOR MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING NON-WOVEN FABRICS OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS ORIGINALS THEREFOR PATTERN CARDS OR CHAINS PHOTOGRAPHY PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES PHYSICS PICTORIAL COMMUNICATION, e.g. TELEVISION PUNCHING OF CARDS RADIATION PYROMETRY SHEDDING MECHANISMS TESTING TEXTILES TRIMMINGS WEAVING
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Author	SHIMODA AKIHISA MORI MASAHIRO SAKATA TOSHIBUMI KAJIURA TOSHIHIRO MASAKI SENYOU
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SubjectTerms	APPARATUS SPECIALLY ADAPTED THEREFOR BRAIDING CALCULATING CINEMATOGRAPHY COLORIMETRY COMPUTING COUNTING DESIGNING PATTERNS ELECTRIC COMMUNICATION TECHNIQUE ELECTRIC DIGITAL DATA PROCESSING ELECTRICITY ELECTROGRAPHY HOLOGRAPHY KNITTING LACE-MAKING MATERIALS THEREFOR MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING NON-WOVEN FABRICS OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS ORIGINALS THEREFOR PATTERN CARDS OR CHAINS PHOTOGRAPHY PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES PHYSICS PICTORIAL COMMUNICATION, e.g. TELEVISION PUNCHING OF CARDS RADIATION PYROMETRY SHEDDING MECHANISMS TESTING TEXTILES TRIMMINGS WEAVING
Title	METHOD OF ANALYZING PATTERN
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