METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

PROBLEM TO BE SOLVED: To avoid a reduction in throughput in manufacturing a semiconductor device by chemical dry etching, and also remove substantially all residues of a metal film while taking care of excessively digging the metal film of an electrode connection hole. SOLUTION: A tungsten film 14 i...

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Bibliographic Details
Main Authors FUKUDA JOJI, ONODA TOSHIYASU, KASAI MASARU
Format Patent
LanguageEnglish
Published 30.06.1998
Edition6
Subjects
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