METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
PROBLEM TO BE SOLVED: To avoid a reduction in throughput in manufacturing a semiconductor device by chemical dry etching, and also remove substantially all residues of a metal film while taking care of excessively digging the metal film of an electrode connection hole. SOLUTION: A tungsten film 14 i...
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Main Authors | , , |
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Format | Patent |
Language | English |
Published |
30.06.1998
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Edition | 6 |
Subjects | |
Online Access | Get full text |
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