METHODS AND APPARATUS FOR SEARCHING FOR DEFECTIVE PATTERN, FOR SEARCHING FOR PATTERN, AND FOR COMPRESSING, RESTORING AND REFERENCING DATA, SEMICONDUCTOR MEMORY TESTER, DEFECTIVE PATTERN SEARCHING SYSTEM AND PRODUCTION MONITOR
PROBLEM TO BE SOLVED: To search for a user-designated arbitrary-shaped detective pattern without deciding and developing test result data compressed in a memory, by compressing data, using a compression system capable of perfectly decoding the data in original data and referencing the data being com...
Saved in:
Main Authors | , , , , |
---|---|
Format | Patent |
Language | English |
Published |
04.11.1997
|
Edition | 6 |
Subjects | |
Online Access | Get full text |
Cover
Loading…
Abstract | PROBLEM TO BE SOLVED: To search for a user-designated arbitrary-shaped detective pattern without deciding and developing test result data compressed in a memory, by compressing data, using a compression system capable of perfectly decoding the data in original data and referencing the data being compressed at arbitrary positions. SOLUTION: Data of test results about all data in a semiconductor memory describing whether each of the cells of a semiconductor memory is food or not are compressed by a method capable of perfectly decoding the data into original data and referencing the data being compressed at arbitrary positions. If required, the compressed data are decoded into the original data. The data being compressed at arbitrary positions are reference among the compressed data. The pattern search is made, using a pattern searching system capable of searching for a pattern of an arbitrary shape among the data under search, without referencing all the data existing in the compressed data under search. |
---|---|
AbstractList | PROBLEM TO BE SOLVED: To search for a user-designated arbitrary-shaped detective pattern without deciding and developing test result data compressed in a memory, by compressing data, using a compression system capable of perfectly decoding the data in original data and referencing the data being compressed at arbitrary positions. SOLUTION: Data of test results about all data in a semiconductor memory describing whether each of the cells of a semiconductor memory is food or not are compressed by a method capable of perfectly decoding the data into original data and referencing the data being compressed at arbitrary positions. If required, the compressed data are decoded into the original data. The data being compressed at arbitrary positions are reference among the compressed data. The pattern search is made, using a pattern searching system capable of searching for a pattern of an arbitrary shape among the data under search, without referencing all the data existing in the compressed data under search. |
Author | SAKATA MASAO ONO MAKOTO NAKURA KOUICHI ARIGA MAKOTO KONISHI JIYUNKO |
Author_xml | – fullname: NAKURA KOUICHI – fullname: ONO MAKOTO – fullname: SAKATA MASAO – fullname: ARIGA MAKOTO – fullname: KONISHI JIYUNKO |
BookMark | eNqNjc9qAjEQh_dgD9r2Hab3LRQ9WI9DMuumkEyYjIInEYmnsgr2hfsmJlKKYA89zb9vvt-kGQ3HIY-bb0_as02AwQLGiIK6StCxQCIU07uwvE6WOjLq1gQRVUlC-wf0e6q2ujDso1BKBWihNMpS2XqWIhQKps4WFdvi8s5wsCtTMPDkWTag5Ymkvc-_iU6bwvirNQrXf8cBPAdXRE_Nw2H3ec7PP_WxeelITf-aT8dtPp92-zzkr-1H7N8W0_fFdDbH2X-YC1TlWOg |
ContentType | Patent |
DBID | EVB |
DatabaseName | esp@cenet |
DatabaseTitleList | |
Database_xml | – sequence: 1 dbid: EVB name: esp@cenet url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP sourceTypes: Open Access Repository |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Medicine Chemistry Sciences Physics |
Edition | 6 |
ExternalDocumentID | JPH09289237A |
GroupedDBID | EVB |
ID | FETCH-epo_espacenet_JPH09289237A3 |
IEDL.DBID | EVB |
IngestDate | Fri Jul 19 15:08:45 EDT 2024 |
IsOpenAccess | true |
IsPeerReviewed | false |
IsScholarly | false |
Language | English |
LinkModel | DirectLink |
MergedId | FETCHMERGED-epo_espacenet_JPH09289237A3 |
Notes | Application Number: JP19970008544 |
OpenAccessLink | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19971104&DB=EPODOC&CC=JP&NR=H09289237A |
ParticipantIDs | epo_espacenet_JPH09289237A |
PublicationCentury | 1900 |
PublicationDate | 19971104 |
PublicationDateYYYYMMDD | 1997-11-04 |
PublicationDate_xml | – month: 11 year: 1997 text: 19971104 day: 04 |
PublicationDecade | 1990 |
PublicationYear | 1997 |
RelatedCompanies | HITACHI LTD |
RelatedCompanies_xml | – name: HITACHI LTD |
Score | 2.4810615 |
Snippet | PROBLEM TO BE SOLVED: To search for a user-designated arbitrary-shaped detective pattern without deciding and developing test result data compressed in a... |
SourceID | epo |
SourceType | Open Access Repository |
SubjectTerms | BASIC ELECTRIC ELEMENTS CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY INFORMATION STORAGE MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES STATIC STORES TESTING |
Title | METHODS AND APPARATUS FOR SEARCHING FOR DEFECTIVE PATTERN, FOR SEARCHING FOR PATTERN, AND FOR COMPRESSING, RESTORING AND REFERENCING DATA, SEMICONDUCTOR MEMORY TESTER, DEFECTIVE PATTERN SEARCHING SYSTEM AND PRODUCTION MONITOR |
URI | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19971104&DB=EPODOC&locale=&CC=JP&NR=H09289237A |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3dT8IwEG8QP98UNYofqYnhaYsC24CHxYy2c5DsI6MQeCJsbIk-DCIz_r3-J14rX4kfT1uv11-TXtq7tndXhO71FuiotG6oIteTqumJrjaTNFKrSQoKETSwHosbXdcznL7WHerDAnpdxcLIPKEfMjkizKgY5nsu1-v55hCLSt_KxUP0AqTZk81NWpkuw8UaVfGaLW2bLPCpTyqEmN2g4oWm89iCrUWt3rB20K4wo0WefTZoi6iU-bZKsY_RXgBoWX6CCklWQodk9fJaCR24ywvvEtqXHprxAojLWbg4RZ8u445Pe9jyKLaCwAot3u9h2M_h79ufjvcsS5TZjPDOgOHA4iL1rfIL07pKoAkC8V0pF2BQMPxwX3hMyOoQAEPmEVGmFrcUwAI5-h7tE2DDLnP9cIQ5NGKh8rP_ra57I-BxJWoQ-qI9rOoYVvgOAJ2hO5tx4qgwauO1iMbdYDPA9XNUzGZZcoFwGkfGZJJGUzA7tYaRgC2q17RmK57Cx9DjS1T-G6f8X-UVOpKJZMUBr3aNivnbe3ID5kEe3Uq5fgH8E66w |
link.rule.ids | 230,309,786,891,25594,76903 |
linkProvider | European Patent Office |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1LT8MwDLbGeN5ggHgTJLRTKxhrO3aoUJdktIM-1GWInSbatRIcNsSK-L38E5ywMSQepzax80WK5ThOHAfg1Gyijcrrli5zPemGmZn6ZZYnei3L0SCiBTZTeaLrB5bbMzr35n0JnmZ3YVSe0DeVHBE1KkV9L9R8_TzfxGIqtnJyljxi1fiqLWxWHU6vizVq8jVb1rJ5FLKQVim1O1E1iG33vImuxUW94SzAYgNdQuUq3bXkrZTn7yalvQ5LEaKNig0oZaMKrNLZy2sVWPGnB94VWFYRmukEK6daONmEd58LN2Rd4gSMOFHkxI7odQn6c-Tz9McLrlWJ8TanwrvjJHKETH2r_cL0RZJosoKGvpILMmgEf0QoIyYUOUbAmAdUlpkjHA2xUI5hwHoU2YjP_TDuE4GNeKz97P9b190-8vgKNYpD2R5ndYIzvIdAW3DS5oK6Oo7a4EtEg040H-D6NpRH41G2AyRPE-vhIU-GuOw0GlaGa1HzwrhspkP8WGa6C3t_4-z9RzyGVVf4t4NbL7jZhzWVVFZu9hoHUC5eXrNDXCoUyZGS8QdM9rGa |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=METHODS+AND+APPARATUS+FOR+SEARCHING+FOR+DEFECTIVE+PATTERN%2C+FOR+SEARCHING+FOR+PATTERN%2C+AND+FOR+COMPRESSING%2C+RESTORING+AND+REFERENCING+DATA%2C+SEMICONDUCTOR+MEMORY+TESTER%2C+DEFECTIVE+PATTERN+SEARCHING+SYSTEM+AND+PRODUCTION+MONITOR&rft.inventor=NAKURA+KOUICHI&rft.inventor=ONO+MAKOTO&rft.inventor=SAKATA+MASAO&rft.inventor=ARIGA+MAKOTO&rft.inventor=KONISHI+JIYUNKO&rft.date=1997-11-04&rft.externalDBID=A&rft.externalDocID=JPH09289237A |