ULTRASONIC CURED LAYER MEASURING APPARATUS BY ELECTRONIC SCANNING

• Main Authors: KINO HIROTOSHI, KODAIRA KOJIRO, KOMATSUZAKI SATORU
• Format: Patent
• Language: English
• Published: 07.06.1996
• Edition: 6
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

PURPOSE: To improve the measuring time, distance and accuracy in the measurement of the cured layer of a columnar specimen having the layer by an ultrasonic wave. CONSTITUTION: The ultrasonic cured layer measuring apparatus can so linearly move an electronic scanning type transmitter group in which incident points are electronically aligned on the circumference by an electronic scanning array type transmitter 2 that an ultrasonic beam transmitted by the transmitter 2 is received by a focusing type receiver 3 via the position of a desired depth in a specimen 1. The propagating speeds of the layers are obtained, and the depth of a cured layer is finally measured from the relationship between the speed and the hardness. The depth of the layer can be more rapidly and accurately measured in the wide range from the surface layer to the interior of the specimen without entirely damaging the specimen.