CHANNEL POTENTIAL DETECTOR FOR CHARGE COUPLED ELEMENT

PURPOSE:To provide a simple method for detecting a channel potential of a charge coupled device. CONSTITUTION:A predetermined voltage VG is applied to a gate G of a transistor 1 under test, a sufficiently large voltage VD is applied to a drain D, and a source S is electrically floated. Here, a volta...

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Bibliographic Details
Main Author ODA HIDETSUGU
Format Patent
LanguageEnglish
Published 21.12.1992
Subjects
BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
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Summary:PURPOSE:To provide a simple method for detecting a channel potential of a charge coupled device. CONSTITUTION:A predetermined voltage VG is applied to a gate G of a transistor 1 under test, a sufficiently large voltage VD is applied to a drain D, and a source S is electrically floated. Here, a voltage generated at a source terminal is monitored by a source voltmeter to be detected as a channel potential.
Bibliography:Application Number: JP19910144339