JP2522140B

• Main Authors: NAKAMURA YOSHUKI, YOSHIDA MASAAKI
• Format: Patent
• Language: English
• Published: 07.08.1996
• Edition: 6
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

A logic circuit associated with a scan path circuit includes at least one clock controller and at least one scan flipflop. The clock controller includes a first control gate receiving a clock signal and a scan mode signal and configured to maintain its output at a fixed value when the scan mode sign...