LIQUID PHYSICAL PROPERTY MEASURING DEVICE, LIQUID PHYSICAL PROPERTY MEASUREMENT SYSTEM, AND LIQUID PHYSICAL PROPERTY MEASUREMENT METHOD AND PROGRAM

• Main Authors: HIRAI HIDEJI, TAGUMA KENICHI, TOGAWA HIROTO, KOBASHIGAWA SHOTA
• Format: Patent
• Language: English; Japanese
• Published: 07.06.2024
• Subjects: CORRECTION OF TYPOGRAPHICAL ERRORS; i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; LINING MACHINES; MEASURING; PERFORMING OPERATIONS; PHYSICS; PRINTING; SELECTIVE PRINTING MECHANISMS; STAMPS; TESTING; TRANSPORTING; TYPEWRITERS

To provide a liquid physical property measuring device, a liquid physical property measurement system, and a liquid physical property measurement method and program capable of reliably measuring liquid physical properties and suppressing upsizing and an increase in a prize of a device.SOLUTION: A li...