DEVICE AND METHOD FOR INSPECTING WORKPIECES

• Main Authors: TERAHAI TAKAFUMI, SATO SACHIHIRO, YAMASHITA KAI
• Format: Patent
• Language: English; Japanese
• Published: 11.10.2023
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

To reduce over-detection of workpiece defects of a given defect type.SOLUTION: An inspection device disclosed herein inputs multiple fragment images extracted from an inspection target image of a workpiece into a learning model designed to take an image as input to output a type (of a defect) so as...