DEVICE AND METHOD FOR INSPECTING WORKPIECES

• Main Authors: TERAHAI TAKAFUMI, SATO SACHIHIRO, YAMASHITA KAI
• Format: Patent
• Language: English; Japanese
• Published: 11.10.2023
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

To reduce over-detection of workpiece defects of a given defect type.SOLUTION: An inspection device disclosed herein inputs multiple fragment images extracted from an inspection target image of a workpiece into a learning model designed to take an image as input to output a type (of a defect) so as to determine the type of a defect for each of the multiple fragment images. The inspection device determines whether defects of a given defect type are in the inspection target image or not according to whether or not a type of defect determined for each of the multiple fragment images is the given defect type.SELECTED DRAWING: Figure 2 【課題】ワークの所定の欠陥種類の欠陥の過剰検出を低減する。【解決手段】検査装置は、画像を入力とし種類を出力とする学習モデルにワークの被検画像から抽出された複数の断片画像をそれぞれ入力することで、当該複数の断片画像それぞれについて種類を判定する。検査装置は、当該複数の断片画像それぞれの判定された種類が所定の欠陥種類であるか否かに基づいて、被検画像に所定の欠陥種類の欠陥が写っているか否かを判定する。【選択図】図２