EYE EXAMINATION DEVICE AND EYE EXAMINATION PROGRAM
To provide an eye examination device capable of acquiring eye refractive power of an eye to be examined depending on a situation.SOLUTION: An eye examination device includes: first objective measuring means for objectively measuring eye refractive power of an eye to be examined by a system different...
Saved in:
Main Author | |
---|---|
Format | Patent |
Language | English Japanese |
Published |
08.06.2023
|
Subjects | |
Online Access | Get full text |
Cover
Loading…
Abstract | To provide an eye examination device capable of acquiring eye refractive power of an eye to be examined depending on a situation.SOLUTION: An eye examination device includes: first objective measuring means for objectively measuring eye refractive power of an eye to be examined by a system different from a photorefraction system; second objective measuring means for objectively measuring the eye refractive power of the eye to be examined by a photorefraction system; and control means for acquiring eye refractive power by controlling at least one of the first objective measuring means and the second objective measuring means. The first objective measuring means measures the eye refractive power by a method different from the photorefraction system by projecting a measuring light beam onto the ocular fundus for one eye to be examined while the second objective measuring means measures the eye refractive power by the photorefraction system by projecting a measuring light beam onto the ocular fundus for both eyes to be examined.SELECTED DRAWING: Figure 1
【課題】 状況に応じた被検眼の眼屈折力を取得できる眼検査装置を提供する。【解決手段】 眼検査装置であって、被検眼の眼屈折力をフォトレフラクション方式とは異なる方式で他覚的に測定する第1他覚式測定手段と、被検眼の眼屈折力をフォトレフラクション方式で他覚的に測定する第2他覚式測定手段と、第1他覚式測定手段及び第2他覚式測定手段の少なくともいずれかを制御して、眼屈折力を取得する制御手段と、を備える。第1他覚式測定手段は、被検眼の片眼に対して、眼底に測定光束を投影することにより、眼屈折力をフォトレフラクション方式とは異なる方式で測定し、第2他覚式測定手段は、被検眼の両眼に対して、眼底に測定光束を投影することにより、眼屈折力をフォトレフラクション方式で測定する。【選択図】 図1 |
---|---|
AbstractList | To provide an eye examination device capable of acquiring eye refractive power of an eye to be examined depending on a situation.SOLUTION: An eye examination device includes: first objective measuring means for objectively measuring eye refractive power of an eye to be examined by a system different from a photorefraction system; second objective measuring means for objectively measuring the eye refractive power of the eye to be examined by a photorefraction system; and control means for acquiring eye refractive power by controlling at least one of the first objective measuring means and the second objective measuring means. The first objective measuring means measures the eye refractive power by a method different from the photorefraction system by projecting a measuring light beam onto the ocular fundus for one eye to be examined while the second objective measuring means measures the eye refractive power by the photorefraction system by projecting a measuring light beam onto the ocular fundus for both eyes to be examined.SELECTED DRAWING: Figure 1
【課題】 状況に応じた被検眼の眼屈折力を取得できる眼検査装置を提供する。【解決手段】 眼検査装置であって、被検眼の眼屈折力をフォトレフラクション方式とは異なる方式で他覚的に測定する第1他覚式測定手段と、被検眼の眼屈折力をフォトレフラクション方式で他覚的に測定する第2他覚式測定手段と、第1他覚式測定手段及び第2他覚式測定手段の少なくともいずれかを制御して、眼屈折力を取得する制御手段と、を備える。第1他覚式測定手段は、被検眼の片眼に対して、眼底に測定光束を投影することにより、眼屈折力をフォトレフラクション方式とは異なる方式で測定し、第2他覚式測定手段は、被検眼の両眼に対して、眼底に測定光束を投影することにより、眼屈折力をフォトレフラクション方式で測定する。【選択図】 図1 |
Author | TAKII MICHIHIRO |
Author_xml | – fullname: TAKII MICHIHIRO |
BookMark | eNrjYmDJy89L5WQwco10VXCNcPT19HMM8fT3U3BxDfN0dlVw9HNRQJcKCPJ3D3L05WFgTUvMKU7lhdLcDEpuriHOHrqpBfnxqcUFicmpeakl8V4BRgZGxgbmlpbGZo7GRCkCALWlKPg |
ContentType | Patent |
DBID | EVB |
DatabaseName | esp@cenet |
DatabaseTitleList | |
Database_xml | – sequence: 1 dbid: EVB name: esp@cenet url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP sourceTypes: Open Access Repository |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Medicine Chemistry Sciences |
DocumentTitleAlternate | 眼検査装置及び眼検査プログラム |
ExternalDocumentID | JP2023079936A |
GroupedDBID | EVB |
ID | FETCH-epo_espacenet_JP2023079936A3 |
IEDL.DBID | EVB |
IngestDate | Fri Jul 19 12:47:34 EDT 2024 |
IsOpenAccess | true |
IsPeerReviewed | false |
IsScholarly | false |
Language | English Japanese |
LinkModel | DirectLink |
MergedId | FETCHMERGED-epo_espacenet_JP2023079936A3 |
Notes | Application Number: JP20210193658 |
OpenAccessLink | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230608&DB=EPODOC&CC=JP&NR=2023079936A |
ParticipantIDs | epo_espacenet_JP2023079936A |
PublicationCentury | 2000 |
PublicationDate | 20230608 |
PublicationDateYYYYMMDD | 2023-06-08 |
PublicationDate_xml | – month: 06 year: 2023 text: 20230608 day: 08 |
PublicationDecade | 2020 |
PublicationYear | 2023 |
RelatedCompanies | NIDEK CO LTD |
RelatedCompanies_xml | – name: NIDEK CO LTD |
Score | 3.6085784 |
Snippet | To provide an eye examination device capable of acquiring eye refractive power of an eye to be examined depending on a situation.SOLUTION: An eye examination... |
SourceID | epo |
SourceType | Open Access Repository |
SubjectTerms | DIAGNOSIS HUMAN NECESSITIES HYGIENE IDENTIFICATION MEDICAL OR VETERINARY SCIENCE SURGERY |
Title | EYE EXAMINATION DEVICE AND EYE EXAMINATION PROGRAM |
URI | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230608&DB=EPODOC&locale=&CC=JP&NR=2023079936A |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwY2BQSTMzSDWzNEnUNTNPTtQ1MU811k1MTE7WtTRLMUlMTjW0TAPfPOfrZ-YRauIVYRrBxJAN2wsDPie0HHw4IjBHJQPzewm4vC5ADGK5gNdWFusnZQKF8u3dQmxd1KC9Y1B72sBCzcXJ1jXA38XfWc3Z2dYrQM0vCCJnDqyMzRyZGVhB7WjQQfuuYU6gbSkFyHWKmyADWwDQuLwSIQamrERhBk5n2NVrwgwcvtAZbyATmvmKRRiMXCNdFVwjHH09IUfYKri4hnk6uyo4-rkooEsFBPm7Bzn6ijIoubmGOHvoAi2Ph3s13isAyaHGYgwsefl5qRIMCsD6JS0txcAw0dw4ySQp2SIJ2CFOTkuxSEw0SzMzTU6VZJDGY5AUXllpBi4QD7z-yUKGgaWkqDRVFljTliTJgUMIAPURfic |
link.rule.ids | 230,309,786,891,25594,76906 |
linkProvider | European Patent Office |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3dT8IwEL8gGvFNUaPix2LM3haHjG48EDPaTphsLGQSfFq6siVqMojM-O_blaHEB96aXnL9SK6_a3v3O4C7FOkJ6hhMQyZnmmEmLY0xzrUOmhmMJ81OKivPeT7qvxjutD2twMc6F0byhH5LckRhUVzYey7P68XfIxaRsZXL-_hNdM0fnbBL1PJ2XPjTuqWSXpcGIzLCKsZdN1D98UpmCjBG9g7smgU9b-E7TXpFWspiE1OcQ9gLhLosP4LKO6tDDa9Lr9Vh3yt_vEWzNL7lMTzQV6rQqe0NVhS2CqGTAaaK7RPlvygYj57GtncCtw4NcV8Tg0e_S43cYGOirVOoZvMsOQNF4EuazvQmM1uxEXMrFhdins4sxlCK2jw5h8YWRRdbpTdQ64feMBoO_OcGHBQSGQtlXUI1__xKrgTq5vG13K0fA42BFA |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=EYE+EXAMINATION+DEVICE+AND+EYE+EXAMINATION+PROGRAM&rft.inventor=TAKII+MICHIHIRO&rft.date=2023-06-08&rft.externalDBID=A&rft.externalDocID=JP2023079936A |