INSPECTION DEVICE, INSPECTION SYSTEM, AND INSPECTION METHOD

• Main Authors: ONO TAKASHI, MARUNO HIROMASA, IHARA MASAHIRO
• Format: Patent
• Language: English; Japanese
• Published: 07.10.2022
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

To inspect the weight of each individual object such as a microplastic efficiently with high accuracy.SOLUTION: One embodiment of an inspection device pertaining to the present invention comprises: a flattening unit (3) for compressively crushing a group of objects scattered on a stage to flatten so...