IMAGE LEARNING DEVICE FOR VISUAL INSPECTION AND VISUAL INSPECTION DEVICE

• Main Authors: NONOMURA HIROYUKI, NISHIHARA ATSUSHI, SHIRASUGA KEIICHI, MORIMOTO TAKAO, KAGANO MIKI
• Format: Patent
• Language: English; Japanese
• Published: 06.10.2022
• Subjects: CALCULATING; COMPUTING; COUNTING; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL; PHYSICS

To provide an image learning device for visual inspection which can accelerate determination and simplify processing, and a visual inspection device using the same.SOLUTION: An image learning device for visual inspection having one learning unit in an image learning system for visual inspection whic...