DEFECT INSPECTION METHOD AND DEFECT INSPECTION DEVICE
To provide a defect inspection method and defect inspection device capable of detecting unevenness in optical properties of a linear polarizing plate in a case where an optical film formed by laminating a protective film and a release film on the linear polarizing plate, is used as a test object.SOL...
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Main Authors | , |
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Format | Patent |
Language | English Japanese |
Published |
08.08.2022
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Subjects | |
Online Access | Get full text |
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