DEFECT INSPECTION METHOD AND DEFECT INSPECTION DEVICE

• Main Authors: MATSUDA SHUNSUKE, KOBAYASHI SHINJI
• Format: Patent
• Language: English; Japanese
• Published: 08.08.2022
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

To provide a defect inspection method and defect inspection device capable of detecting unevenness in optical properties of a linear polarizing plate in a case where an optical film formed by laminating a protective film and a release film on the linear polarizing plate, is used as a test object.SOL...