MEASUREMENT DEVICE

• Main Authors: NAKAO TSUTOMU, TAKEMURA SHOTA
• Format: Patent
• Language: English; Japanese
• Published: 18.11.2021
• Subjects: MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; PHYSICS; TESTING

To correct calibration data to an appropriate value without interrupting a width measurement even when an optical layout changes in a measurement device measuring a width of an object to be measured, and to suppress a measurement error.SOLUTION: A measurement device comprises: a light source; a line...