SWITCHING ELEMENT AND MANUFACTURING METHOD OF SWITCHING ELEMENT

To provide a switching element capable of suppressing the deterioration of rectification characteristics.SOLUTION: A switching element includes: a first wiring that is formed extending in a first direction on a first insulator film; a second wiring that is formed extending in a second direction cros...

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Bibliographic Details
Main Author KITADA HIDEKI
Format Patent
LanguageEnglish
Japanese
Published 27.05.2021
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Summary:To provide a switching element capable of suppressing the deterioration of rectification characteristics.SOLUTION: A switching element includes: a first wiring that is formed extending in a first direction on a first insulator film; a second wiring that is formed extending in a second direction crossing the first direction on a second insulator film; an ion conductive layer that is located between the first wiring and the second wiring in an area where the first wiring and the second wiring cross and is directly connected to the second wiring so as to conduct metal ion supplied from the second wiring; and a metal oxide film located between the first wiring and the ion conductive layer.SELECTED DRAWING: Figure 3 【課題】整流特性の劣化を抑制すること。【解決手段】第1絶縁膜に設けられ、第1方向に延びた第1配線と、第2絶縁膜に設けられ、前記第1方向に交差する第2方向に延びた第2配線と、前記第1配線と前記第2配線が交差する交差領域で前記第1配線と前記第2配線との間に挟まれ且つ前記第2配線に直接接し、前記第2配線から供給される金属イオンを伝導可能なイオン伝導層と、前記第1配線と前記イオン伝導層との間に挟まれた金属酸化膜と、を備えるスイッチ素子。【選択図】図3
Bibliography:Application Number: JP20190206984