DISPLAY DEVICE
To examine internal stress of a semiconductor device including a conductive film, which is affected by the internal stress of the conductive film.SOLUTION: A semiconductor device including an n-channel type TFT provided on an insulating surface is configured so that impurity elements are introduced...
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Main Author | |
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Format | Patent |
Language | English Japanese |
Published |
08.04.2021
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Subjects | |
Online Access | Get full text |
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