HOLE INSPECTION METHOD AND HOLE INSPECTION DEVICE

To remove limitations, due to a size of a microphone, on a plane size of an inspection object component and a hole formed in the inspection object component, and also enable high-precision hole inspection.SOLUTION: A hole inspection device comprises: a speaker 110 installed in a closed type enclosur...

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Main Authors TSUCHIYA HARUYUKI, NAGASU YOSHINORI
Format Patent
LanguageEnglish
Japanese
Published 30.04.2020
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Abstract To remove limitations, due to a size of a microphone, on a plane size of an inspection object component and a hole formed in the inspection object component, and also enable high-precision hole inspection.SOLUTION: A hole inspection device comprises: a speaker 110 installed in a closed type enclosure 100 having an opening 102; a speaker drive part 120 which makes a frequency sweep of the speaker 110; a standard microphone 130 which outputs an electric signal depending upon a flow rate of fluid passing through a hole when the frequency sweep of the speaker 110 is made with a component having the hole placed covering the opening; a frequency analysis part 140 which performs frequency analysis of the electric signal output from the standard microphone 130 to generate a resonance frequency spectrum; and a hole inspection part 150 which determines whether the hole is proper based upon the resonance frequency spectrum. It is determined whether the hole is proper based upon the reference resonance frequency generated corresponding to a master sample and an inspection object resonance spectrum generated corresponding to the inspection object component.SELECTED DRAWING: Figure 1 【課題】検査対象部品の平面サイズ及び当該検査対象部品に形成されている孔がマイクロホンのサイズによって制限されることなく、かつ、高精度な孔検査を可能とする。【解決手段】開口102を有する密閉型の筐体100内に設置されたスピーカー110と、スピーカー110を周波数掃引するスピーカー駆動部120と、孔を有する部品が開口を覆うように載置された状態でスピーカー110を周波数掃引したときに、孔を通過する流体の流量に依存した電気信号を出力する標準マイクロホン130と、標準マイクロホン130から出力される電気信号を周波数分析して共鳴周波数スペクトルを生成する周波数分析部140と、共鳴周波数スペクトルに基づいて、孔の適否を判定する孔検査部150とを備え、マスターサンプに対応して生成された基準共鳴周波数スペクトルと、検査対象部品に対応して生成された検査対象共鳴周波数スペクトルとに基づいて、孔の適否を判定する。【選択図】図1
AbstractList To remove limitations, due to a size of a microphone, on a plane size of an inspection object component and a hole formed in the inspection object component, and also enable high-precision hole inspection.SOLUTION: A hole inspection device comprises: a speaker 110 installed in a closed type enclosure 100 having an opening 102; a speaker drive part 120 which makes a frequency sweep of the speaker 110; a standard microphone 130 which outputs an electric signal depending upon a flow rate of fluid passing through a hole when the frequency sweep of the speaker 110 is made with a component having the hole placed covering the opening; a frequency analysis part 140 which performs frequency analysis of the electric signal output from the standard microphone 130 to generate a resonance frequency spectrum; and a hole inspection part 150 which determines whether the hole is proper based upon the resonance frequency spectrum. It is determined whether the hole is proper based upon the reference resonance frequency generated corresponding to a master sample and an inspection object resonance spectrum generated corresponding to the inspection object component.SELECTED DRAWING: Figure 1 【課題】検査対象部品の平面サイズ及び当該検査対象部品に形成されている孔がマイクロホンのサイズによって制限されることなく、かつ、高精度な孔検査を可能とする。【解決手段】開口102を有する密閉型の筐体100内に設置されたスピーカー110と、スピーカー110を周波数掃引するスピーカー駆動部120と、孔を有する部品が開口を覆うように載置された状態でスピーカー110を周波数掃引したときに、孔を通過する流体の流量に依存した電気信号を出力する標準マイクロホン130と、標準マイクロホン130から出力される電気信号を周波数分析して共鳴周波数スペクトルを生成する周波数分析部140と、共鳴周波数スペクトルに基づいて、孔の適否を判定する孔検査部150とを備え、マスターサンプに対応して生成された基準共鳴周波数スペクトルと、検査対象部品に対応して生成された検査対象共鳴周波数スペクトルとに基づいて、孔の適否を判定する。【選択図】図1
Author TSUCHIYA HARUYUKI
NAGASU YOSHINORI
Author_xml – fullname: TSUCHIYA HARUYUKI
– fullname: NAGASU YOSHINORI
BookMark eNrjYmDJy89L5WQw9PD3cVXw9AsOcHUO8fT3U_B1DfHwd1Fw9HNRQJdycQ3zdHblYWBNS8wpTuWF0twMSm6uIc4euqkF-fGpxQWJyal5qSXxXgFGBkYGBmbmJgYmjsZEKQIAiVYoiA
ContentType Patent
DBID EVB
DatabaseName esp@cenet
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
Physics
DocumentTitleAlternate 孔検査方法及び孔検査装置
ExternalDocumentID JP2020067404A
GroupedDBID EVB
ID FETCH-epo_espacenet_JP2020067404A3
IEDL.DBID EVB
IngestDate Fri Jul 19 12:58:36 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language English
Japanese
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_JP2020067404A3
Notes Application Number: JP20180201316
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20200430&DB=EPODOC&CC=JP&NR=2020067404A
ParticipantIDs epo_espacenet_JP2020067404A
PublicationCentury 2000
PublicationDate 20200430
PublicationDateYYYYMMDD 2020-04-30
PublicationDate_xml – month: 04
  year: 2020
  text: 20200430
  day: 30
PublicationDecade 2020
PublicationYear 2020
RelatedCompanies NAGANO PREFECTURE
MISUZU KOGYO:KK
RelatedCompanies_xml – name: NAGANO PREFECTURE
– name: MISUZU KOGYO:KK
Score 3.3895614
Snippet To remove limitations, due to a size of a microphone, on a plane size of an inspection object component and a hole formed in the inspection object component,...
SourceID epo
SourceType Open Access Repository
SubjectTerms MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
Title HOLE INSPECTION METHOD AND HOLE INSPECTION DEVICE
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20200430&DB=EPODOC&locale=&CC=JP&NR=2020067404A
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfR1dS8NALMz5-aZVUadSRPpWdOutrQ9Ftt6VWuwHUsfeRttrQYVu2Ip_3_TW6fBhj5dAyIVLcrnkEoBb8mBwkxNdTfJEU4nO-02S0FSzROsXBh4ITYzz8QPdfSXedDjtwMfqL4zoE_otmiOiRmWo77Ww14u_Rywqaiuru_QNQfNHJ7ao0kbHA9HCSqFji0UhDW3Fti0vUoKXJU43yD0ZbcE23qONpv6LTcbNt5TFuk9xDmEnQnJlfQSd90SCfXs1ek2CPb_NeEuwK0o0swqBrRpWx9B3w2cmY9wdMVEDIvssdkMqjwIq_0dRNnmy2QncOCy2XRW5mP3ueeZFaxxrp9At52V-BjLJCjRiKcq3yDA0y9NEG5hFjlENT5Mh5-fQ20DoYiO2BwfNapkruYRu_fmVX6HLrdNrIaoffUd_Mg
link.rule.ids 230,309,783,888,25578,76886
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfR3LSsNAcKj1UW9aLWp9BJHcgqbZpvEQpM1uSGNeSCy9lTxBhbTYiL_vZJtq8dDrDAyzw87Mzs4L4I48DlItJaoUZZEiETWVqyShJiWRIucDvBAKX-fjeqr1Suxpf9qAj3UvDJ8T-s2HI6JGJajvJbfXi79PLMprK5f38RuC5k9mqFOxjo57fISVSEc6C3zqG6Jh6HYgei8rnDogD2S4A7v4xtYqdWCTUdWWstj0KeYR7AVIriiPofEetaFlrFevteHArTPebdjnJZrJEoG1Gi5PQLZ8hwkYdweM14AILgstnwpDjwr_UZRNxgY7hVuThYYlIRez3zPP7GCDY6UDzWJeZGcgkCRHIxajfPMEQ7MsjpSelmcY1aRx1E_Tc-huIXSxFXsDLSt0nZkz9p67cFhhVnmTS2iWn1_ZFbrfMr7mYvsBnwmCJA
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=HOLE+INSPECTION+METHOD+AND+HOLE+INSPECTION+DEVICE&rft.inventor=TSUCHIYA+HARUYUKI&rft.inventor=NAGASU+YOSHINORI&rft.date=2020-04-30&rft.externalDBID=A&rft.externalDocID=JP2020067404A