THREE-DIMENSIONAL SHAPE MEASURING SYSTEM, THREE-DIMENSIONAL SHAPE MEASURING METHOD, AND THREE-DIMENSIONAL SHAPE MEASURING PROGRAM

• Main Author: SUMIYOSHI SHINICHI
• Format: Patent
• Language: English; Japanese
• Published: 06.02.2020
• Subjects: CALCULATING; COMPUTING; COUNTING; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL; MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; PHYSICS; TESTING

To provide a three-dimensional shape measuring system, a three-dimensional shape measuring method and a three-dimensional shape measuring program with which it is possible to measure a three-dimensional shape applying a TDC method, even when there is interreflection light on an object having strong...