THREE-DIMENSIONAL SHAPE MEASURING SYSTEM, THREE-DIMENSIONAL SHAPE MEASURING METHOD, AND THREE-DIMENSIONAL SHAPE MEASURING PROGRAM
To provide a three-dimensional shape measuring system, a three-dimensional shape measuring method and a three-dimensional shape measuring program with which it is possible to measure a three-dimensional shape applying a TDC method, even when there is interreflection light on an object having strong...
Saved in:
Main Author | |
---|---|
Format | Patent |
Language | English Japanese |
Published |
06.02.2020
|
Subjects | |
Online Access | Get full text |
Cover
Loading…
Be the first to leave a comment!