PARTICLE MEASURING DEVICE

To provide a particle measuring device capable of accurately measuring a physical quantity of sample particles in slurry.SOLUTION: A particle measuring device includes: a first vessel for housing slurry; a second vessel for housing liquid for dilution; a third vessel for housing a diluted solution o...

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Main Author MURAKAMI SHINICHI
Format Patent
LanguageEnglish
Japanese
Published 19.09.2019
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Abstract To provide a particle measuring device capable of accurately measuring a physical quantity of sample particles in slurry.SOLUTION: A particle measuring device includes: a first vessel for housing slurry; a second vessel for housing liquid for dilution; a third vessel for housing a diluted solution obtained by diluting the slurry with the liquid for dilution; and a circulation pipe for circulating the slurry in the first vessel at the outside of the first vessel. A first pipe for supplying at least the slurry into the third vessel is connected to the circulation pipe by using a first pipe connection member which is a branch joint member, a second pipe for supplying the liquid for dilution in the second vessel into the third vessel via the first pipe is connected to a downstream side of the first pipe connection member of the first pipe by using a second pipe connection member which is a branch joint member, and the first pipe connection member and the second pipe connection member are provided respectively so that a height position of the second pipe connection member is higher than a height position of the first pipe connection member.SELECTED DRAWING: Figure 1 【課題】スラリー中の試料粒子の物理量を正確に測定することができる粒子測定装置を提供する。【解決手段】スラリーを収容する第一容器と、希釈用液を収容する第二容器と、スラリーを希釈用液で希釈した希釈液を収容する第三容器と、第一容器内のスラリーを第一容器の外部で循環させる循環管と、を有し、循環管には、少なくともスラリーを第三容器内へ供給する第一管が、分岐継手部材である第一管接続部材を用いて接続されており、第一管の第一管接続部材よりも下流側には、第二容器内の希釈用液を第一管を介して第三容器内へ供給する第二管が、分岐継手部材である第二管接続部材を用いて接続されており、第一管接続部材および第二管接続部材は、第二管接続部材の高さ位置が第一管接続部材の高さ位置より高くなるように、それぞれ設けられている。【選択図】図1
AbstractList To provide a particle measuring device capable of accurately measuring a physical quantity of sample particles in slurry.SOLUTION: A particle measuring device includes: a first vessel for housing slurry; a second vessel for housing liquid for dilution; a third vessel for housing a diluted solution obtained by diluting the slurry with the liquid for dilution; and a circulation pipe for circulating the slurry in the first vessel at the outside of the first vessel. A first pipe for supplying at least the slurry into the third vessel is connected to the circulation pipe by using a first pipe connection member which is a branch joint member, a second pipe for supplying the liquid for dilution in the second vessel into the third vessel via the first pipe is connected to a downstream side of the first pipe connection member of the first pipe by using a second pipe connection member which is a branch joint member, and the first pipe connection member and the second pipe connection member are provided respectively so that a height position of the second pipe connection member is higher than a height position of the first pipe connection member.SELECTED DRAWING: Figure 1 【課題】スラリー中の試料粒子の物理量を正確に測定することができる粒子測定装置を提供する。【解決手段】スラリーを収容する第一容器と、希釈用液を収容する第二容器と、スラリーを希釈用液で希釈した希釈液を収容する第三容器と、第一容器内のスラリーを第一容器の外部で循環させる循環管と、を有し、循環管には、少なくともスラリーを第三容器内へ供給する第一管が、分岐継手部材である第一管接続部材を用いて接続されており、第一管の第一管接続部材よりも下流側には、第二容器内の希釈用液を第一管を介して第三容器内へ供給する第二管が、分岐継手部材である第二管接続部材を用いて接続されており、第一管接続部材および第二管接続部材は、第二管接続部材の高さ位置が第一管接続部材の高さ位置より高くなるように、それぞれ設けられている。【選択図】図1
Author MURAKAMI SHINICHI
Author_xml – fullname: MURAKAMI SHINICHI
BookMark eNrjYmDJy89L5WSQDHAMCvF09nFV8HV1DA4N8vRzV3BxDfN0duVhYE1LzClO5YXS3AxKbq4hzh66qQX58anFBYnJqXmpJfFeAUYGhpaGphamphaOxkQpAgAj1yI5
ContentType Patent
DBID EVB
DatabaseName esp@cenet
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
Physics
DocumentTitleAlternate 粒子測定装置
ExternalDocumentID JP2019158558A
GroupedDBID EVB
ID FETCH-epo_espacenet_JP2019158558A3
IEDL.DBID EVB
IngestDate Fri Jul 19 12:58:49 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language English
Japanese
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_JP2019158558A3
Notes Application Number: JP20180045009
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20190919&DB=EPODOC&CC=JP&NR=2019158558A
ParticipantIDs epo_espacenet_JP2019158558A
PublicationCentury 2000
PublicationDate 20190919
PublicationDateYYYYMMDD 2019-09-19
PublicationDate_xml – month: 09
  year: 2019
  text: 20190919
  day: 19
PublicationDecade 2010
PublicationYear 2019
RelatedCompanies SUMITOMO METAL MINING CO LTD
RelatedCompanies_xml – name: SUMITOMO METAL MINING CO LTD
Score 3.3491435
Snippet To provide a particle measuring device capable of accurately measuring a physical quantity of sample particles in slurry.SOLUTION: A particle measuring device...
SourceID epo
SourceType Open Access Repository
SubjectTerms INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
Title PARTICLE MEASURING DEVICE
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20190919&DB=EPODOC&locale=&CC=JP&NR=2019158558A
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1dS8MwFL3M-fmmVXFOpYj0rWhJl64PRVyashW7FZljbyNJW5iCDlvx73sbOt3THpPAzQec3HOTkxuAO9nLaZ5ljk2JFLYriGNLT_m2VES4HqGE6O98kjEdvrrxvDdvwfv6LYzOE_qjkyMiohTivdL79er_ECvU2sryXi6x6vMxmgah1UTH6N18RGA4CHg6CSfMYiyIU2v8otscpMa9_tMO7CKP9mo48Nmgfpay2vQp0THspWjuozqB1psw4JCtv14z4CBpbrwN2NcSTVViZQPD8hQ6KdLQEXvmZsJxX6wFDWbIZyPGz-A24lM2tLG3xd_cFnG6MTJyDm0M-vMLMGXRlwVB-kv8ws0KKR4UMpVMFZLSnArSge4WQ5dbW7twVJdq1YPjX0G7-vrOr9G1VvJGL8kvLIt5vA
link.rule.ids 230,309,783,888,25576,76882
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3dS8MwED_m_JhvWh3O-VFE9la0pM3ahyEuzdhm2xWZY28jSVtQQYet-O97DZvuaa93cLkEfveRXO4AbqWb0SxNbYsSKSxHENuSXeVbUhHhdAklRI_ziWI6fHHGc3deg_f1XxjdJ_RHN0dERCnEe6nt9fL_EivQtZXFnXxF0ufDYNoLOqvsGL2bjwgM-j2eTIIJ6zDWGyed-FnzbAyNXe9xB3YxxvaqcQd81q--pSw3fcrgCPYSFPdRHkPtTRjQYOvRawYcRKsXbwP2dYmmKpC4gmFxAq0Ew9ARC7kZcbSLVUGDGfDZiPFTuBnwKRtauNrib2-LcbKhGWlCHZP-7AxMmXsyJ6gl8XMnzaW4VxippCqXlGZUkBa0twg638q9hsZwGoWLcBQ_teGw4lQVELZ_AfXy6zu7RDdbyit9PL8IyXys
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=PARTICLE+MEASURING+DEVICE&rft.inventor=MURAKAMI+SHINICHI&rft.date=2019-09-19&rft.externalDBID=A&rft.externalDocID=JP2019158558A