EVALUATION METHOD

• Main Authors: SAKAI MASAMICHI, OMORI MIHO, SUNAKAWA TAKUMI
• Format: Patent
• Language: English; Japanese
• Published: 12.09.2019
• Subjects: BASIC ELECTRIC ELEMENTS; ELECTRICITY; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSIONOF CHEMICAL INTO ELECTRICAL ENERGY; TESTING

To provide an evaluation method of evaluating the distribution of physical quantities representing the electrical characteristics on the surface of an active material layer.SOLUTION: An evaluation method (S1) includes a first step of acquiring a microscopic image (step S13), a second step (step S14) of defining N points P(i is 1≤i≤N) located in the microscope image, a third step (step S15) of measuring a physical quantity (resistance R) representing the electrical characteristics in the vicinity of each point P, and in the third step (step S15), the physical quantity is measured by bringing a first probe and a second probe into contact with a first point Pand a second point Psandwiching each point P, respectively.SELECTED DRAWING: Figure 1 【課題】活物質層の表面における電気特性を表す物理量の分布を評価する評価方法を提供すること。【解決手段】評価方法（Ｓ１）は、顕微鏡像を取得する第１工程（工程Ｓ１３）と、前記顕微鏡像内に位置するＮ個の点Ｐｉ（ｉは、１≦ｉ≦Ｎ）を定める第２工程（工程Ｓ１４）と、各点Ｐｉ近傍の電気特性を表す物理量（抵抗Ｒｉ）を測定する第３工程（工程Ｓ１５）と、を含み、第３工程（工程Ｓ１５）は、各点Ｐｉを挟み込む第１の点Ｐｉ１及び第２の点Ｐｉ２の各々に、それぞれ第１のプローブ及び第２のプローブを接触させることによって、前記物理量を測定する。【選択図】図１