SEMICONDUCTOR DEVICE, AND CURRENT CONSUMPTION TESTING METHOD

• Main Author: KOBAYASHI KAUHITO
• Format: Patent
• Language: English; Japanese
• Published: 10.05.2018
• Subjects: APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC,OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWERSUPPLY SYSTEMS; BASIC ELECTRIC ELEMENTS; CIRCUIT ARRANGEMENTS OR SYSTEMS FOR SUPPLYING OR DISTRIBUTINGELECTRIC POWER; CONTROL OR REGULATION THEREOF; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUTPOWER; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR; ELECTRICITY; GENERATION; MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; SEMICONDUCTOR DEVICES; SYSTEMS FOR STORING ELECTRIC ENERGY; TESTING

PROBLEM TO BE SOLVED: To provide a semiconductor device and a current consumption testing method capable of shortening a time required for testing before product shipment.SOLUTION: A semiconductor device 100 comprises: a power supply circuit 12 that generates a first power supply voltage and a second power supply voltage lower than the first power supply voltage, and that, in a first mode, selects the first power supply voltage and supplies it to a power supplying line GL, and that, in a second mode, selects the second power supply voltage and supplies it to the power supplying line; and a discharge circuit 13 that, in a case where a test signal is received, and the power supply circuit makes a transition from a state where the first power supply voltage is selected to a state where the second power supply voltage is selected, connects the power supplying line with a ground line to execute discharge.SELECTED DRAWING: Figure 1 【課題】製品出荷前のテストに費やされる時間を短縮することが可能な半導体装置及び消費電流テスト方法を提供する。【解決手段】半導体装置１００は、第１の電源電圧及び第１の電源電圧よりも低い第２の電源電圧を生成し、第１モード時には第１の電源電圧を選択して電源供給ラインＧＬに供給し、第２モード時には第２の電源電圧を選択して電源供給ラインに供給する電源回路１２と、テスト信号を受け、且つ、電源回路が第１の電源電圧を選択している状態から第２の電源電圧を選択する状態に遷移した場合に、電源供給ラインを接地ラインに接続して放電実行する放電回路１３と、を有する。【選択図】図１