DEVICE FOR CONTROLLING POWER CYCLE EVALUATION TEST OF SEMICONDUCTOR ELEMENT

• Main Authors: UMADONO SHINJI, OKUHIGASHI YUKI, ISHIKAWA HIROYUKI, MATSUMURA KEI, TAKADA SHINJI
• Format: Patent
• Language: English; Japanese
• Published: 21.09.2017
• Subjects: BASIC ELECTRIC ELEMENTS; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR; ELECTRICITY; MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; SEMICONDUCTOR DEVICES; TESTING

PROBLEM TO BE SOLVED: To provide a device for controlling the power cycle evaluation test of a semiconductor element with which it is possible to simulate a thermal environment condition during an in-service period.SOLUTION: The present invention is characterized in that heat radiation means 10 is c...