SPECTROSCOPE

PROBLEM TO BE SOLVED: To provide a spectroscope which can measure target lights from one or more samples at the same time, without increasing the number of parts if the number of samples to be measured is increased.SOLUTION: A spectroscope includes: one or more incident openings; a collimator lens;...

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Bibliographic Details
Main Authors MIZUUCHI KIMINORI, SAKAGUCHI AKIRA
Format Patent
LanguageEnglish
Japanese
Published 31.08.2017
Subjects
COLORIMETRY
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT
MEASURING
PHYSICS
RADIATION PYROMETRY
TESTING
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Summary:PROBLEM TO BE SOLVED: To provide a spectroscope which can measure target lights from one or more samples at the same time, without increasing the number of parts if the number of samples to be measured is increased.SOLUTION: A spectroscope includes: one or more incident openings; a collimator lens; a polarization division birefringence element; a polarizer; a Fourier transformation lens; and a detector. Each incident opening defines a luminous flux of a target light. At least one of the incident openings is offset-arranged with respect to the optical axis of the collimator lens. The detector acquires an interferogram of the target light based on the distribution of intensity of interference fringes formed by the Fourier transformation lens.SELECTED DRAWING: Figure 1 【課題】測定する試料の数が増えても部品点数を増やすことなく、１または２以上の試料から放出される対象光を同時に測定できる分光装置を提供すること。【解決手段】分光装置は、１または２以上の入射開口と、コリメータレンズと、偏光分割複屈折素子と、偏光子と、フーリエ変換レンズと、検出部とを有する。入射開口は、対象光の光束を規定する。１または２以上の入射開口の少なくとも１つは、コリメータレンズの光軸に対してオフセット配置されている。検出部は、フーリエ変換レンズにより形成された干渉縞の強度分布に基づいて対象光のインターフェログラムを取得する。【選択図】図１
Bibliography:Application Number: JP20160034392