MEASUREMENT CONTROL DEVICE

PROBLEM TO BE SOLVED: To provide a measurement control device capable of sharply reducing adjustment time of a PID control parameter, and making the quality uniform at the same time.SOLUTION: The measurement control device comprises: a camera C for acquiring optical data displayed on a display unit...

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Main Authors MACHIDA HIROSHI, TADANO YUGO, NOMURA MASAKATSU
Format Patent
LanguageEnglish
Japanese
Published 27.07.2017
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Abstract PROBLEM TO BE SOLVED: To provide a measurement control device capable of sharply reducing adjustment time of a PID control parameter, and making the quality uniform at the same time.SOLUTION: The measurement control device comprises: a camera C for acquiring optical data displayed on a display unit D1 of a control device PC; an image analysis part A for reading a value of a meter of the display unit D1 on the basis of the data acquired by the camera C; a data collection part L for storing the value of the meter read by the image analysis part A in association with time obtained from a clock CL; an identification part ID for identifying a transfer function of the system on the basis of the data stored by the data collection part L; an adjustment part T for calculating an optimal PID control parameter on the basis of the transfer function of the system identified by the identification part ID and a predetermined setting condition; and a parameter display unit D2 for displaying an arithmetic result by the adjustment part T.SELECTED DRAWING: Figure 1 【課題】PID制御パラメータの調整時間を大幅に減らすと同時にその質も均一化することができる計測制御装置を提供する。【解決手段】制御装置PCの表示器D1に表示された光学的なデータを取得するカメラCと、カメラCによって取得したデータに基づいて表示器D1のメータの値を読み取る画像解析部Aと、画像解析部Aによって読み取ったメータの値を時計CLから得た時刻と関連付けて保存するデータ収集部Lと、データ収集部Lにより保存したデータを基にシステムの伝達関数を同定する同定部IDと、同定部IDにより同定したシステムの伝達関数と予め定めた設定条件とに基づいて最適なPID制御パラメータを演算する調節部Tと、調節部Tによる演算結果を表示するパラメータ表示器D2とから計測制御装置を構成した。【選択図】図1
AbstractList PROBLEM TO BE SOLVED: To provide a measurement control device capable of sharply reducing adjustment time of a PID control parameter, and making the quality uniform at the same time.SOLUTION: The measurement control device comprises: a camera C for acquiring optical data displayed on a display unit D1 of a control device PC; an image analysis part A for reading a value of a meter of the display unit D1 on the basis of the data acquired by the camera C; a data collection part L for storing the value of the meter read by the image analysis part A in association with time obtained from a clock CL; an identification part ID for identifying a transfer function of the system on the basis of the data stored by the data collection part L; an adjustment part T for calculating an optimal PID control parameter on the basis of the transfer function of the system identified by the identification part ID and a predetermined setting condition; and a parameter display unit D2 for displaying an arithmetic result by the adjustment part T.SELECTED DRAWING: Figure 1 【課題】PID制御パラメータの調整時間を大幅に減らすと同時にその質も均一化することができる計測制御装置を提供する。【解決手段】制御装置PCの表示器D1に表示された光学的なデータを取得するカメラCと、カメラCによって取得したデータに基づいて表示器D1のメータの値を読み取る画像解析部Aと、画像解析部Aによって読み取ったメータの値を時計CLから得た時刻と関連付けて保存するデータ収集部Lと、データ収集部Lにより保存したデータを基にシステムの伝達関数を同定する同定部IDと、同定部IDにより同定したシステムの伝達関数と予め定めた設定条件とに基づいて最適なPID制御パラメータを演算する調節部Tと、調節部Tによる演算結果を表示するパラメータ表示器D2とから計測制御装置を構成した。【選択図】図1
Author NOMURA MASAKATSU
TADANO YUGO
MACHIDA HIROSHI
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Snippet PROBLEM TO BE SOLVED: To provide a measurement control device capable of sharply reducing adjustment time of a PID control parameter, and making the quality...
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SubjectTerms CONTROL OR REGULATING SYSTEMS IN GENERAL
CONTROLLING
FUNCTIONAL ELEMENTS OF SUCH SYSTEMS
MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS
PHYSICS
REGULATING
Title MEASUREMENT CONTROL DEVICE
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