SURFACE INFORMATION DETECTION SYSTEM AND IMAGE FORMATION DEVICE

• Main Authors: MIYAGAKI KAZUYA, MONMA SUSUMU
• Format: Patent
• Language: English; Japanese
• Published: 29.06.2017
• Subjects: CINEMATOGRAPHY; ELECTROGRAPHY; ELECTROPHOTOGRAPHY; HOLOGRAPHY; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MAGNETOGRAPHY; MEASURING; PHOTOGRAPHY; PHYSICS; TESTING

PROBLEM TO BE SOLVED: To enable a proper monitoring of illumination light by a simple configuration, and to allow information on a surface state of an object to be properly detected.SOLUTION: A surface information detection system is configured to: irradiate a surface to be detected 61a with light from an array LED light source 21; detect reflection light from the surface to be detected 61a by a PD array 22; detect information pertaining to a surface state of the surface to be detected 61a; and sequentially reflect and deflect radiation light from the array LED light source 21 at a first reflection surface 27a, second reflection surface 27b and third reflection surface 27c of an optical path deflection member 27 to make the reflected and deflected radiation light incident upon the PD array 22, and monitor a change in amount of light of the LED light source 21. The optical path deflection member 27 is composed of: a first reflection member 27-1 that forms the first reflection surface 27a and third reflection surface 27c; and a second reflection member 27-2 that forms the second reflection surface 27b with a normal line of a reflection surface directed downwards.SELECTED DRAWING: Figure 1 【課題】 簡単な構成で照明光の適正なモニタリングを可能として対象物の表面状態の情報の適正な検出を可能とする。【解決手段】 表面情報検出システムは、アレイＬＥＤ光源２１からの光を被検出面６１ａに照射し、被検出面６１ａからの反射光をＰＤアレイ２２により検出して、被検出面６１ａの表面状態に係る情報を検出する。アレイＬＥＤ光源２１からの放射光を光路偏向部材２７の第１の反射面２７ａと、第２の反射面２７ｂと、第３の反射面２７ｃで順次反射偏向してＰＤアレイ２２に入射させてＬＥＤ光源２１の光量変動をモニタリングする。光路偏向部材２７は、第１の反射面２７ａと第３の反射面２７ｃを形成する第１の反射部材２７−１と、反射面の法線方向を下方に向けて第２の反射面２７ｂを形成する第２の反射部材２７−２とで構成している。【選択図】 図１