ION SOURCE, QUADRUPOLE MASS SPECTROMETER AND RESIDUAL GAS ANALYZING METHOD
PROBLEM TO BE SOLVED: To provide an ion source capable of efficiently extracting ions.SOLUTION: An ion source 21 according to the present invention includes: a conductive tubular body 212 having an ion emitting aperture 212P in a tip surface thereof and a penetration portion in a side face thereof a...
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Format | Patent |
Language | English Japanese |
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22.06.2017
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Abstract | PROBLEM TO BE SOLVED: To provide an ion source capable of efficiently extracting ions.SOLUTION: An ion source 21 according to the present invention includes: a conductive tubular body 212 having an ion emitting aperture 212P in a tip surface thereof and a penetration portion in a side face thereof allowing thermo-electrons to pass through from the outside toward the inside; a mesh 213 arranged at the outside of the penetration portion; and a thermo-electron emission filament 214 arranged at the outside of the mesh 213. The ion source is configured such that the thermo-electrons emitted from the thermo-electron emission filament 214 penetrate the mesh 213 and reach the inside of the conductive tubular body 212 through the penetration portion.SELECTED DRAWING: Figure 4
【課題】イオンを効率よく引き出すことができるイオン源を提供することを主な目的とする。【解決手段】本発明に係るイオン源21は、先端面にイオン射出口212Pを有し、側面には外側から内側に向かって熱電子を通過させることができる貫通部を有する導電性筒状体212と、前記貫通部の外側に配置されたメッシュ213と、前記メッシュ213の外側に配置された熱電子放出用フィラメント214とを具備し、前記熱電子放出用フィラメント214から放出された熱電子が前記メッシュ213を貫通し、前記貫通部を通って前記導電性筒状体212の内部に到達するように構成されたことを特徴とする。【選択図】図4 |
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AbstractList | PROBLEM TO BE SOLVED: To provide an ion source capable of efficiently extracting ions.SOLUTION: An ion source 21 according to the present invention includes: a conductive tubular body 212 having an ion emitting aperture 212P in a tip surface thereof and a penetration portion in a side face thereof allowing thermo-electrons to pass through from the outside toward the inside; a mesh 213 arranged at the outside of the penetration portion; and a thermo-electron emission filament 214 arranged at the outside of the mesh 213. The ion source is configured such that the thermo-electrons emitted from the thermo-electron emission filament 214 penetrate the mesh 213 and reach the inside of the conductive tubular body 212 through the penetration portion.SELECTED DRAWING: Figure 4
【課題】イオンを効率よく引き出すことができるイオン源を提供することを主な目的とする。【解決手段】本発明に係るイオン源21は、先端面にイオン射出口212Pを有し、側面には外側から内側に向かって熱電子を通過させることができる貫通部を有する導電性筒状体212と、前記貫通部の外側に配置されたメッシュ213と、前記メッシュ213の外側に配置された熱電子放出用フィラメント214とを具備し、前記熱電子放出用フィラメント214から放出された熱電子が前記メッシュ213を貫通し、前記貫通部を通って前記導電性筒状体212の内部に到達するように構成されたことを特徴とする。【選択図】図4 |
Author | NAKAZONO MASANOBU NAKAI JUNYA KATSUTA TOMOKO YABUSHITA HIROTAKA |
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DocumentTitleAlternate | イオン源、四重極型質量分析計、及び残留ガス分析方法 |
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Snippet | PROBLEM TO BE SOLVED: To provide an ion source capable of efficiently extracting ions.SOLUTION: An ion source 21 according to the present invention includes: a... |
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SubjectTerms | BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY |
Title | ION SOURCE, QUADRUPOLE MASS SPECTROMETER AND RESIDUAL GAS ANALYZING METHOD |
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