TEST AND MEASUREMENT INSTRUMENT AND METHOD OF DETERMINING COMPENSATION VALUE

PROBLEM TO BE SOLVED: To enable compensation of phase and amplitude error of an ATI digitizer using a built-in compensation signal oscillator.SOLUTION: Memories 400, 402 of a test and measurement instrument store predetermined filter coefficient sets. One of the predetermined filter coefficient sets...

Full description

Saved in:
Bibliographic Details
Main Authors HICKMAN BARTON T, KNIERIM DANIEL G
Format Patent
LanguageEnglish
Japanese
Published 12.01.2017
Subjects
BASIC ELECTRONIC CIRCUITRY
CODE CONVERSION IN GENERAL
CODING
DECODING
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
Online AccessGet full text

Cover

More Information
Summary:PROBLEM TO BE SOLVED: To enable compensation of phase and amplitude error of an ATI digitizer using a built-in compensation signal oscillator.SOLUTION: Memories 400, 402 of a test and measurement instrument store predetermined filter coefficient sets. One of the predetermined filter coefficient sets is selected based on a clock delay and clock skew measured using a compensation signal oscillator 300 and is loaded onto an LTP filter 70. Time adjustment circuits 74, 76 may adjust clocks that drive mixers 46, 52.SELECTED DRAWING: Figure 15 【課題】内蔵の補償信号発生器を用いて、ＡＴＩデジタイザの位相及び振幅エラーを補償可能にする。【解決手段】試験測定装置のメモリ４００及び４０２は、予め定めた複数のフィルタ係数セットを記憶する。これら複数のフィルタ係数セットの中から、補償信号発生器３００を用いて測定したクロック遅延及びクロック・スキューに基いて、１つのフィルタ係数セットが選択され、ＬＴＰフィルタ７０にロードされる。また、時間調整回路７４及び７６は、ミキサ４６及び５２を駆動するクロックを調整しても良い。【選択図】図１５
Bibliography:Application Number: JP20160122158