MEASUREMENT DEVICE AND METHOD, AND MEASUREMENT SYSTEM

• Main Authors: MAEKAWA NAOSHI, HORI SHIGEO, KUMAKI SHIGEHISA, WATANABE NAOHIRO
• Format: Patent
• Language: English; Japanese
• Published: 06.10.2016
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

PROBLEM TO BE SOLVED: To provide a measurement device and method and a measurement system which each allow for reception of a signal output from an object to be tested and regeneration of the received signal at desired timing.SOLUTION: The measurement device is provided that comprises: a signal rece...