DISPLACEMENT MEASUREMENT DEVICE AND DISPLACEMENT CALCULATION METHOD

• Main Authors: MOTOHI TOSHIYA, SUGIMURA YOSHIFUMI, YOSHIDA KENICHI, MATSUSHITA TAKASHI, MOCHIZUKI MAKI, NISHII HIROYASU, CHIBA DAISUKE
• Format: Patent
• Language: English; Japanese
• Published: 20.06.2016
• Subjects: MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC ORINFRASONIC WAVES; MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; PHYSICS; TESTING

PROBLEM TO BE SOLVED: To provide a displacement measurement device with which it is possible to reliably measure the magnitude of displacement of a structure and a displacement magnitude calculation method for calculating the magnitude of displacement of the structure in this displacement measuremen...