SUBSTRATE TREATMENT SYSTEM

PROBLEM TO BE SOLVED: To provide a substrate treatment system that can stably supply treatment liquid of a predetermined concentration to a treatment unit.SOLUTION: A substrate treatment system comprises: a first fluid supply flow passage (77) for supplying fluid; a second fluid supply flow passage...

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Main Authors ICHINOMIYA KENJI, ISHIDA YOSHITAKA
Format Patent
LanguageEnglish
Japanese
Published 16.04.2015
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Abstract PROBLEM TO BE SOLVED: To provide a substrate treatment system that can stably supply treatment liquid of a predetermined concentration to a treatment unit.SOLUTION: A substrate treatment system comprises: a first fluid supply flow passage (77) for supplying fluid; a second fluid supply flow passage (79) in which a solution module (72) for solving gas into the fluid is provided in a middle part; a first pressure regulator (81) provided in the first fluid supply flow passage; a second pressure regulator (82) provided in the second fluid supply flow passage; a treatment liquid supply flow passage (80) that merges the first fluid supply flow passage with the second fluid supply flow passage and supplies the treatment liquid to a treatment unit (16); and flow rate regulators (84) which are provided downstream from the first pressure regulator in the first fluid supply flow passage and between downstream from the second pressure regulator in the second fluid supply flow passage and upstream from the solution module in the second fluid supply flow passage, and which, when an inner pressure of the first fluid supply flow passage increases or decreases relative to the inner pressure of the second fluid supply flow passage, decreases or increases the flow rate of the fluid flowing through the second fluid supply flow passage. 【課題】基板処理システムにおいて所定濃度の処理液を処理ユニットに安定して供給すること。【解決手段】本発明では、流体を供給する第1の流体供給流路(77)と、流体にガスを溶解させるための溶解モジュール(72)を中途部に設けた第2の流体供給流路(79)と、第1の流体供給流路に設けられた第1の圧力調整器(81)と、第2の流体供給流路に設けられた第2の圧力調整器(82)と、第1の流体供給流路と第2の流体供給流路とを合流させて処理ユニット(16)に処理液を供給する処理液供給流路(80)と、第1の流体供給流路の第1の圧力調整器よりも下流側と第2の流体供給流路の第2の圧力調整器よりも下流側であって溶解モジュールよりも上流側との間に設けられ、第1の流体供給流路の内圧が第2の流体供給流路の内圧に対して増大又は減少したときに第2の流体供給流路を流れる流体の流量を減少又は増大させる流量調整器(84)とを有することにした。【選択図】図3
AbstractList PROBLEM TO BE SOLVED: To provide a substrate treatment system that can stably supply treatment liquid of a predetermined concentration to a treatment unit.SOLUTION: A substrate treatment system comprises: a first fluid supply flow passage (77) for supplying fluid; a second fluid supply flow passage (79) in which a solution module (72) for solving gas into the fluid is provided in a middle part; a first pressure regulator (81) provided in the first fluid supply flow passage; a second pressure regulator (82) provided in the second fluid supply flow passage; a treatment liquid supply flow passage (80) that merges the first fluid supply flow passage with the second fluid supply flow passage and supplies the treatment liquid to a treatment unit (16); and flow rate regulators (84) which are provided downstream from the first pressure regulator in the first fluid supply flow passage and between downstream from the second pressure regulator in the second fluid supply flow passage and upstream from the solution module in the second fluid supply flow passage, and which, when an inner pressure of the first fluid supply flow passage increases or decreases relative to the inner pressure of the second fluid supply flow passage, decreases or increases the flow rate of the fluid flowing through the second fluid supply flow passage. 【課題】基板処理システムにおいて所定濃度の処理液を処理ユニットに安定して供給すること。【解決手段】本発明では、流体を供給する第1の流体供給流路(77)と、流体にガスを溶解させるための溶解モジュール(72)を中途部に設けた第2の流体供給流路(79)と、第1の流体供給流路に設けられた第1の圧力調整器(81)と、第2の流体供給流路に設けられた第2の圧力調整器(82)と、第1の流体供給流路と第2の流体供給流路とを合流させて処理ユニット(16)に処理液を供給する処理液供給流路(80)と、第1の流体供給流路の第1の圧力調整器よりも下流側と第2の流体供給流路の第2の圧力調整器よりも下流側であって溶解モジュールよりも上流側との間に設けられ、第1の流体供給流路の内圧が第2の流体供給流路の内圧に対して増大又は減少したときに第2の流体供給流路を流れる流体の流量を減少又は増大させる流量調整器(84)とを有することにした。【選択図】図3
Author ISHIDA YOSHITAKA
ICHINOMIYA KENJI
Author_xml – fullname: ICHINOMIYA KENJI
– fullname: ISHIDA YOSHITAKA
BookMark eNrjYmDJy89L5WSQCg51Cg4JcgxxVQgJcnUM8XX1C1EIjgwOcfXlYWBNS8wpTuWF0twMSm6uIc4euqkF-fGpxQWJyal5qSXxXgFGBoamBuaGhibmjsZEKQIAaXEiwQ
ContentType Patent
DBID EVB
DatabaseName esp@cenet
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
Physics
DocumentTitleAlternate 基板処理システム
ExternalDocumentID JP2015071147A
GroupedDBID EVB
ID FETCH-epo_espacenet_JP2015071147A3
IEDL.DBID EVB
IngestDate Fri Jul 19 12:58:21 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language English
Japanese
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_JP2015071147A3
Notes Application Number: JP20130208433
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20150416&DB=EPODOC&CC=JP&NR=2015071147A
ParticipantIDs epo_espacenet_JP2015071147A
PublicationCentury 2000
PublicationDate 20150416
PublicationDateYYYYMMDD 2015-04-16
PublicationDate_xml – month: 04
  year: 2015
  text: 20150416
  day: 16
PublicationDecade 2010
PublicationYear 2015
RelatedCompanies TOKYO ELECTRON LTD
RelatedCompanies_xml – name: TOKYO ELECTRON LTD
Score 3.0940008
Snippet PROBLEM TO BE SOLVED: To provide a substrate treatment system that can stably supply treatment liquid of a predetermined concentration to a treatment...
SourceID epo
SourceType Open Access Repository
SubjectTerms BASIC ELECTRIC ELEMENTS
CONTROLLING
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MIXING, e.g. DISSOLVING, EMULSIFYING, DISPERSING
PERFORMING OPERATIONS
PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
PHYSICS
REGULATING
SEMICONDUCTOR DEVICES
SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
TRANSPORTING
Title SUBSTRATE TREATMENT SYSTEM
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20150416&DB=EPODOC&locale=&CC=JP&NR=2015071147A
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1LS8NAEB5qfd40KtqqBJHcgjZtss0hSPOiBNKGZiv1VLLJBlTQYiL-fWfXVHvqcWdh9gGz883OC-AOMTk3coPpRcGEgcKZbmc210leiA5IxDJLkY0cT6zxfBAtzEUL3ta5MLJO6LcsjogSlaO81_K9Xv1_YvkytrK6Zy9I-ngMqeNrjXWM6AYBhua7TpBM_amneZ4TJdpk9jtHEPyT0Q7sIo4m0mp7ckVaympTp4THsJcgu_f6BFqvmQKH3rr1mgIHcePxVmBfhmjmFRIbMaxOoZPOXdHsmAYqnQUjKgryq-lzSoP4DG7DgHpjHZdb_h1uGSUbW-ufQxutfn4B6gMjZSYdo-VwMLQ5Q1zWKxHelX2zINy4hO4WRp2ts104EiPhFOlZV9CuP7_4NerWmt3IO_kBoyB5JQ
link.rule.ids 230,309,783,888,25577,76883
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1ZS8NAEB5qPeqbRkVbjyCSt6BNj6QPRZqLGJs0NFupT6GbbEAFLSbi33d2TbVPfZ2B2QNm55udC-AGMTnTUo2qWUa5g8KoOlgMmKqnGZ-ApPd7Oa9GDsK-N-v68968Bm-rWhjRJ_RbNEdEjUpR30vxXi__P7FskVtZ3NIXJH3cu2RoK5V3jOgGAYZim0MnmtgTS7GsoR8p4fSXpyP410dbsI0Y2xC-0pPJy1KW6zbFPYCdCMW9l4dQe11I0LBWo9ck2AuqiLcEuyJFMy2QWKlhcQTNeGbyYcfEkcnUGRHekF-On2PiBMdw7TrE8lRcLvk7XOJHa1vrnEAdvX52CvId1fOFCIzmRtcYMIq4rJ0jvMs7vUxn2hm0NghqbuReQcMjwTgZP4SPLdjnHB4gaffPoV5-frELtLMlvRT38wN44HwV
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=SUBSTRATE+TREATMENT+SYSTEM&rft.inventor=ICHINOMIYA+KENJI&rft.inventor=ISHIDA+YOSHITAKA&rft.date=2015-04-16&rft.externalDBID=A&rft.externalDocID=JP2015071147A