X-RAY INSPECTION DEVICE

PROBLEM TO BE SOLVED: To provide an X-ray inspection device that accurately inspects an object in which area values or volume values of content are different by row due to a conveyance position of the content.SOLUTION: An X-ray inspection device 1 includes: an image processing part 43 that applies t...

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Bibliographic Details
Main Authors KANAI TAKASHI, MORIYA JUNICHI, MIYAZAKI ITARU
Format Patent
LanguageEnglish
Published 19.12.2013
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:PROBLEM TO BE SOLVED: To provide an X-ray inspection device that accurately inspects an object in which area values or volume values of content are different by row due to a conveyance position of the content.SOLUTION: An X-ray inspection device 1 includes: an image processing part 43 that applies the same image processing algorithm for rows of the content of an object, to an X-ray image output by an X-ray detector 10, for image processing; and a determination part 44 that determines a shape quality of the object W by use of quality determination threshold (an upper limit value and a lower limit value) set for each of the rows of content, with respect to the X-ray image image-processed by the image processing part 43.
Bibliography:Application Number: JP20120128867