METHOD OF FORMING SEMICONDUCTOR DEVICES HAVING WAFER BACK-SIDE CAPACITORS
PROBLEM TO BE SOLVED: To provide a method of forming semiconductor devices having wafer back-side capacitors.SOLUTION: A method includes the following steps of: preparing an SOI substrate having a buried insulating layer inserted between a front-side active silicon layer and a back-side bulk silicon...
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Main Authors | , , , , , , |
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Format | Patent |
Language | English |
Published |
02.05.2013
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Abstract | PROBLEM TO BE SOLVED: To provide a method of forming semiconductor devices having wafer back-side capacitors.SOLUTION: A method includes the following steps of: preparing an SOI substrate having a buried insulating layer inserted between a front-side active silicon layer and a back-side bulk silicon layer; forming on the front side of the SOI substrate an integrated circuit including a buried contact plug extending from the front side of the SOI substrate while penetrating through the buried insulating layer; performing back-side etching process to form a trench in the bulk silicon layer and expose an end part of the buried contact plug to the back side surface of the buried insulating layer; and forming in a trench a capacitor including a first capacitor plate, a second capacitor plate, and a capacitor dielectric layer inserted between the first and second capacitor plates. The first capacitor plate is formed to contact with the exposed end part of the buried contact plug. |
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AbstractList | PROBLEM TO BE SOLVED: To provide a method of forming semiconductor devices having wafer back-side capacitors.SOLUTION: A method includes the following steps of: preparing an SOI substrate having a buried insulating layer inserted between a front-side active silicon layer and a back-side bulk silicon layer; forming on the front side of the SOI substrate an integrated circuit including a buried contact plug extending from the front side of the SOI substrate while penetrating through the buried insulating layer; performing back-side etching process to form a trench in the bulk silicon layer and expose an end part of the buried contact plug to the back side surface of the buried insulating layer; and forming in a trench a capacitor including a first capacitor plate, a second capacitor plate, and a capacitor dielectric layer inserted between the first and second capacitor plates. The first capacitor plate is formed to contact with the exposed end part of the buried contact plug. |
Author | RADENS CARL JOHN WONG KEITH KWONG HON TIMOTHY JOSEPH DALTON VIDYA RAMACHANDRAN HSU LOUIS LUN YANG CHIHAO LAWRENCE CLEVENGER |
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Notes | Application Number: JP20130019016 |
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Snippet | PROBLEM TO BE SOLVED: To provide a method of forming semiconductor devices having wafer back-side capacitors.SOLUTION: A method includes the following steps... |
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SubjectTerms | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY SEMICONDUCTOR DEVICES |
Title | METHOD OF FORMING SEMICONDUCTOR DEVICES HAVING WAFER BACK-SIDE CAPACITORS |
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