METHOD OF FORMING SEMICONDUCTOR DEVICES HAVING WAFER BACK-SIDE CAPACITORS

PROBLEM TO BE SOLVED: To provide a method of forming semiconductor devices having wafer back-side capacitors.SOLUTION: A method includes the following steps of: preparing an SOI substrate having a buried insulating layer inserted between a front-side active silicon layer and a back-side bulk silicon...

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Main Authors HSU LOUIS LUN, VIDYA RAMACHANDRAN, WONG KEITH KWONG HON, LAWRENCE CLEVENGER, RADENS CARL JOHN, TIMOTHY JOSEPH DALTON, YANG CHIHAO
Format Patent
LanguageEnglish
Published 02.05.2013
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Abstract PROBLEM TO BE SOLVED: To provide a method of forming semiconductor devices having wafer back-side capacitors.SOLUTION: A method includes the following steps of: preparing an SOI substrate having a buried insulating layer inserted between a front-side active silicon layer and a back-side bulk silicon layer; forming on the front side of the SOI substrate an integrated circuit including a buried contact plug extending from the front side of the SOI substrate while penetrating through the buried insulating layer; performing back-side etching process to form a trench in the bulk silicon layer and expose an end part of the buried contact plug to the back side surface of the buried insulating layer; and forming in a trench a capacitor including a first capacitor plate, a second capacitor plate, and a capacitor dielectric layer inserted between the first and second capacitor plates. The first capacitor plate is formed to contact with the exposed end part of the buried contact plug.
AbstractList PROBLEM TO BE SOLVED: To provide a method of forming semiconductor devices having wafer back-side capacitors.SOLUTION: A method includes the following steps of: preparing an SOI substrate having a buried insulating layer inserted between a front-side active silicon layer and a back-side bulk silicon layer; forming on the front side of the SOI substrate an integrated circuit including a buried contact plug extending from the front side of the SOI substrate while penetrating through the buried insulating layer; performing back-side etching process to form a trench in the bulk silicon layer and expose an end part of the buried contact plug to the back side surface of the buried insulating layer; and forming in a trench a capacitor including a first capacitor plate, a second capacitor plate, and a capacitor dielectric layer inserted between the first and second capacitor plates. The first capacitor plate is formed to contact with the exposed end part of the buried contact plug.
Author RADENS CARL JOHN
WONG KEITH KWONG HON
TIMOTHY JOSEPH DALTON
VIDYA RAMACHANDRAN
HSU LOUIS LUN
YANG CHIHAO
LAWRENCE CLEVENGER
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– fullname: LAWRENCE CLEVENGER
– fullname: RADENS CARL JOHN
– fullname: TIMOTHY JOSEPH DALTON
– fullname: YANG CHIHAO
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Snippet PROBLEM TO BE SOLVED: To provide a method of forming semiconductor devices having wafer back-side capacitors.SOLUTION: A method includes the following steps...
SourceID epo
SourceType Open Access Repository
SubjectTerms BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
Title METHOD OF FORMING SEMICONDUCTOR DEVICES HAVING WAFER BACK-SIDE CAPACITORS
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