THERMOPHYSICAL PROPERTY ANALYSIS DEVICE AND THERMOPHYSICAL PROPERTY ANALYSIS METHOD USING THE SAME

• Main Authors: MIYAKE AYA, TAKAMATSU HIROYUKI, MIYAKE SHUGO, INUI MASAHIRO
• Format: Patent
• Language: English
• Published: 04.10.2012
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

PROBLEM TO BE SOLVED: To provide a thermophysical property analysis device capable of accurately analyzing and evaluating thermophysical properties of an object to be measured even when spatial resolution is increased, and to provide an analysis method using the thermophysical property analysis device.SOLUTION: The thermophysical property analysis device includes detection light irradiation means including detection light emitting means 20 and an optical system 40 for detection light which guides detection light B2 up to a measuring portion 11a to irradiate the measuring portion 11a with the detection light B2. The optical system 40 for detection light includes optical path length control means 42 for changing optical path length and an optical waveguide 45 arranged on the downstream side of the means 42 to emit the detection light B2 to a predetermined direction by propagating the detection light made incident on the inside by repeating total reflection. The optical waveguide 45 is arranged so that an incident surface 45a is turned to such a direction that the detection light B2 can be made incident onto the optical waveguide 45 on a position at which the detection light B2 arrives under a total reflection condition and the size of the incident surface 45 is larger than the beam width of the incident detection light B2.