SEMICONDUCTOR INTEGRATED CIRCUIT

PROBLEM TO BE SOLVED: To ensure an external terminal required for a test input for inputting a test signal to a functional block so as to test the functional block even if the number of the functional blocks is large. SOLUTION: A semiconductor integrated circuit 1 of the invention includes: the exte...

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Bibliographic Details
Main Authors KIZU NAOKI, SUGANO MIKI
Format Patent
LanguageEnglish
Published 23.10.2008
Subjects
BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
SEMICONDUCTOR DEVICES
TESTING
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Summary:PROBLEM TO BE SOLVED: To ensure an external terminal required for a test input for inputting a test signal to a functional block so as to test the functional block even if the number of the functional blocks is large. SOLUTION: A semiconductor integrated circuit 1 of the invention includes: the external terminal 11; the functional block 14a for receiving the signal from the external terminal 11 during a test operation; a CPU register 12 for applying the signal to the functional block 14a during the test operation instead of the external terminal 11; and the functional block 14b for receiving the test signal from the external terminal 11 during the test operation. COPYRIGHT: (C)2009,JPO&INPIT
Bibliography:Application Number: JP20070098949