POROGEN, POROGENATED PRECURSOR AND METHOD FOR USING THE SAME TO PROVIDE POROUS ORGANOSILICA GLASS FILM WITH LOW DIELECTRIC CONSTANT
PROBLEM TO BE SOLVED: To provide a porous organosilica glass film which has a low dielectric constant, improved mechanical properties, thermal stability and chemical resistance. SOLUTION: The produced porous organosilica glass film has a composition expressed by the formula SivOwCxHyFz, wherein v+w+...
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Language | English |
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16.08.2007
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Abstract | PROBLEM TO BE SOLVED: To provide a porous organosilica glass film which has a low dielectric constant, improved mechanical properties, thermal stability and chemical resistance. SOLUTION: The produced porous organosilica glass film has a composition expressed by the formula SivOwCxHyFz, wherein v+w+x+y+z=100%; v is 10 to 35 atom%; w is 10 to 65 atom%; x is 5 to 30 atom%; y is 10 to 50 atom%; and z is 0 to 15 atom%. The production method comprises the steps of: introducing a precursor selected from the group consisting of organosilane and organosiloxane, and a gaseous reagent containing the porogen into a vacuum chamber; and applying energy to the gaseous reagent to make the gaseous reagent react and form a preliminary film on a substrate. The preliminary film has pores. Substantially all of the porogen are removed so as to obtain the porous film with a dielectric constant of less than 2.6. COPYRIGHT: (C)2007,JPO&INPIT |
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AbstractList | PROBLEM TO BE SOLVED: To provide a porous organosilica glass film which has a low dielectric constant, improved mechanical properties, thermal stability and chemical resistance. SOLUTION: The produced porous organosilica glass film has a composition expressed by the formula SivOwCxHyFz, wherein v+w+x+y+z=100%; v is 10 to 35 atom%; w is 10 to 65 atom%; x is 5 to 30 atom%; y is 10 to 50 atom%; and z is 0 to 15 atom%. The production method comprises the steps of: introducing a precursor selected from the group consisting of organosilane and organosiloxane, and a gaseous reagent containing the porogen into a vacuum chamber; and applying energy to the gaseous reagent to make the gaseous reagent react and form a preliminary film on a substrate. The preliminary film has pores. Substantially all of the porogen are removed so as to obtain the porous film with a dielectric constant of less than 2.6. COPYRIGHT: (C)2007,JPO&INPIT |
Author | VRTIS RAYMOND NICHOLAS LUKAS AARON SCOTT O'NEILL MARK LEONARD XIAO MANCHAO NORMAN JOHN A T VINCENT JEAN LOUISE |
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Snippet | PROBLEM TO BE SOLVED: To provide a porous organosilica glass film which has a low dielectric constant, improved mechanical properties, thermal stability and... |
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SubjectTerms | BASIC ELECTRIC ELEMENTS CHEMICAL SURFACE TREATMENT CHEMISTRY COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL COATING MATERIAL WITH METALLIC MATERIAL COATING METALLIC MATERIAL DIFFUSION TREATMENT OF METALLIC MATERIAL ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL METALLURGY SEMICONDUCTOR DEVICES SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION |
Title | POROGEN, POROGENATED PRECURSOR AND METHOD FOR USING THE SAME TO PROVIDE POROUS ORGANOSILICA GLASS FILM WITH LOW DIELECTRIC CONSTANT |
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