POROGEN, POROGENATED PRECURSOR AND METHOD FOR USING THE SAME TO PROVIDE POROUS ORGANOSILICA GLASS FILM WITH LOW DIELECTRIC CONSTANT

PROBLEM TO BE SOLVED: To provide a porous organosilica glass film which has a low dielectric constant, improved mechanical properties, thermal stability and chemical resistance. SOLUTION: The produced porous organosilica glass film has a composition expressed by the formula SivOwCxHyFz, wherein v+w+...

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Main Authors NORMAN JOHN A T, VINCENT JEAN LOUISE, XIAO MANCHAO, O'NEILL MARK LEONARD, LUKAS AARON SCOTT, VRTIS RAYMOND NICHOLAS
Format Patent
LanguageEnglish
Published 16.08.2007
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Abstract PROBLEM TO BE SOLVED: To provide a porous organosilica glass film which has a low dielectric constant, improved mechanical properties, thermal stability and chemical resistance. SOLUTION: The produced porous organosilica glass film has a composition expressed by the formula SivOwCxHyFz, wherein v+w+x+y+z=100%; v is 10 to 35 atom%; w is 10 to 65 atom%; x is 5 to 30 atom%; y is 10 to 50 atom%; and z is 0 to 15 atom%. The production method comprises the steps of: introducing a precursor selected from the group consisting of organosilane and organosiloxane, and a gaseous reagent containing the porogen into a vacuum chamber; and applying energy to the gaseous reagent to make the gaseous reagent react and form a preliminary film on a substrate. The preliminary film has pores. Substantially all of the porogen are removed so as to obtain the porous film with a dielectric constant of less than 2.6. COPYRIGHT: (C)2007,JPO&INPIT
AbstractList PROBLEM TO BE SOLVED: To provide a porous organosilica glass film which has a low dielectric constant, improved mechanical properties, thermal stability and chemical resistance. SOLUTION: The produced porous organosilica glass film has a composition expressed by the formula SivOwCxHyFz, wherein v+w+x+y+z=100%; v is 10 to 35 atom%; w is 10 to 65 atom%; x is 5 to 30 atom%; y is 10 to 50 atom%; and z is 0 to 15 atom%. The production method comprises the steps of: introducing a precursor selected from the group consisting of organosilane and organosiloxane, and a gaseous reagent containing the porogen into a vacuum chamber; and applying energy to the gaseous reagent to make the gaseous reagent react and form a preliminary film on a substrate. The preliminary film has pores. Substantially all of the porogen are removed so as to obtain the porous film with a dielectric constant of less than 2.6. COPYRIGHT: (C)2007,JPO&INPIT
Author VRTIS RAYMOND NICHOLAS
LUKAS AARON SCOTT
O'NEILL MARK LEONARD
XIAO MANCHAO
NORMAN JOHN A T
VINCENT JEAN LOUISE
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Snippet PROBLEM TO BE SOLVED: To provide a porous organosilica glass film which has a low dielectric constant, improved mechanical properties, thermal stability and...
SourceID epo
SourceType Open Access Repository
SubjectTerms BASIC ELECTRIC ELEMENTS
CHEMICAL SURFACE TREATMENT
CHEMISTRY
COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
COATING MATERIAL WITH METALLIC MATERIAL
COATING METALLIC MATERIAL
DIFFUSION TREATMENT OF METALLIC MATERIAL
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL
METALLURGY
SEMICONDUCTOR DEVICES
SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION
Title POROGEN, POROGENATED PRECURSOR AND METHOD FOR USING THE SAME TO PROVIDE POROUS ORGANOSILICA GLASS FILM WITH LOW DIELECTRIC CONSTANT
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