APPARATUS FOR MARKING DEFECT

PROBLEM TO BE SOLVED: To provide an apparatus for marking a defect, which detects a defect in a long sheet product conveyed in a longitudinal direction by an inspection apparatus and places a mark at the detected defect part accurately and clearly. SOLUTION: The apparatus detects a defect in the lon...

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Bibliographic Details
Main Author SHIBATA KENRO
Format Patent
LanguageEnglish
Published 10.05.2007
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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