CIRCUIT ATTACHED TO DIGITAL TESTER AND DIGITAL TESTER

• Main Authors: FUKUTOMI TAKESHI, WATANABE TSUNAHISA, NISHIWAKI MASAHIRO, SAITO MITSUTAKA, MATSUMOTO AKIRA, KOIKE MICHIO, MIYAZAWA TOSHIAKI, NAKAMA RYOICHI
• Format: Patent
• Language: English
• Published: 11.08.2005
• Edition: 7
• Subjects: CONVERSION OR DISTRIBUTION OF ELECTRIC POWER; ELECTRICITY; EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS; GENERATION; MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

PROBLEM TO BE SOLVED: To provide a digital tester for normally performing continuity test and resistance-value measurement test even between measurement terminals where an induction voltage is generated. SOLUTION: This tester is equipped with a switching element 21 for temporarily short-circuiting measurement terminals 4 when a terminal voltage between the measurement terminals 4 for thereto connecting an apparatus under measurement exceeds a threshold, and a filtering circuit 23 for limiting the terminal voltage between the measurement terminals 4 to or less than a threshold by absorbing a surge voltage arising from a switching motion. This attached circuit limits a rise in induction voltage placed between the terminals 4 to or less than a threshold. This makes it possible to prevent an overrange due to an induction voltage or incapable measurement from occurring when performing continuity test or electrical resistance measurement on an apparatus by using this digital tester. COPYRIGHT: (C)2005,JPO&NCIPI