METHOD AND SYSTEM FOR RECONSTRUCTING INTERNAL FEATURE

PROBLEM TO BE SOLVED: To provide a method and a system of nondestructive inspection for reconstructing internal features on an object, allowing high precision inner structure measurement. SOLUTION: This method for reconstruction of the inner surface shape (10) of a component (20) contains a stage fo...

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Bibliographic Details
Main Authors REBELLO ALEXANDER BERNARD FLAVIAN, HOWARD DONALD ROBERT, HARDING KEVIN GEORGE
Format Patent
LanguageEnglish
Published 21.04.2005
Edition7
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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Summary:PROBLEM TO BE SOLVED: To provide a method and a system of nondestructive inspection for reconstructing internal features on an object, allowing high precision inner structure measurement. SOLUTION: This method for reconstruction of the inner surface shape (10) of a component (20) contains a stage for aligning the thickness map (30) of the component with outer surface data (40) of the component. The thickness map comprises a large number of thickness data (32). Inner surface data (12) are generated by using both the thickness map (30) and the outer surface data (40) to reconstruct inner surface geometric figure. COPYRIGHT: (C)2005,JPO&NCIPI
Bibliography:Application Number: JP20040283050