TRACE-MEASURING APPARATUS

PROBLEM TO BE SOLVED: To provide a probe for trace-measuring apparatus in which the contact load can be made light weight. SOLUTION: The probe 1 is formed into a rectangular shape, constituted so that an end face 10 of its distal end becomes a rectangular shape, its one side is formed in a linear co...

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Bibliographic Details
Main Author FURUMI TADASHI
Format Patent
LanguageEnglish
Published 10.09.2003
Edition7
Subjects
BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
SEMICONDUCTOR DEVICES
TESTING
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Summary:PROBLEM TO BE SOLVED: To provide a probe for trace-measuring apparatus in which the contact load can be made light weight. SOLUTION: The probe 1 is formed into a rectangular shape, constituted so that an end face 10 of its distal end becomes a rectangular shape, its one side is formed in a linear contact side 11, and its both ends are rounded. The side 11 is brought into contact with an object to be measured so as to be substantially perpendicular to the tracing direction, an its contact area is expanded to moderate a contact load. Simultaneously, increase in the contact area in the tracing direction is not produced and increase in wear will not occur without increasing the measuring pitch. COPYRIGHT: (C)2003,JPO
Bibliography:Application Number: JP20020053953