MONITORING SYSTEM

PROBLEM TO BE SOLVED: To realize a monitoring system which can improve plotting efficiency, easily handles a plurality of pieces of data and easily reuses a drawing condition. SOLUTION: This monitoring system using an industrial framework is provided with a plurality of measuring instruments for mea...

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Bibliographic Details
Main Author IGUCHI HIROKAZU
Format Patent
LanguageEnglish
Published 31.07.2003
Edition7
Subjects
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Summary:PROBLEM TO BE SOLVED: To realize a monitoring system which can improve plotting efficiency, easily handles a plurality of pieces of data and easily reuses a drawing condition. SOLUTION: This monitoring system using an industrial framework is provided with a plurality of measuring instruments for measuring a physical value of an object to be monitored and a terminal for monitoring constructed by using the industrial framework and for receiving a plurality of pieces of data from the plurality of measuring instruments and displaying the received data on a screen when a preset plotting condition is established. COPYRIGHT: (C)2003,JPO
Bibliography:Application Number: JP20020011007