TWO-WAVELENGTH PHOTOIONIZATION MASS SPECTROMETER

• Main Author: FUTAMI HIROSHI
• Format: Patent
• Language: English
• Published: 19.07.2002
• Edition: 7
• Subjects: BASIC ELECTRIC ELEMENTS; ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS; ELECTRICITY; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

PROBLEM TO BE SOLVED: To provide a two-wavelength photoionization mass spectrometer capable of directly analyzing dioxins in exhaust gas. SOLUTION: This mass spectrometer is equipped with a sample introduction means 15 for introducing continuously exhaust gas 13 from a gas duct 12 into a vacuum chamber 11 as leakage molecular beams 14, a first laser irradiation means comprising a wavelength fixed laser 18a and a wavelength variable laser 18b for irradiating first pulse laser beams 17 into the introduced leakage molecular beams 14 through a condensing lens 16, a second laser irradiation means comprising the wavelength fixed laser 18a for irradiating the condensing position of the first laser beams 17 with second pulse laser beams 19 in the spatially overlapped state without the aid of the condensing lens, and a time-of- flight mass spectrometer 22 equipped with an ion detector 21 for analyzing molecular ion 20 generated by being ionized by irradiating the leakage molecular beams 14 with the first laser beams 17 and the second laser beams 19 in the spatially and temporally overlapped state.