PARALLEL LOADING UNIT OF PROBE BLOCK FOR INSPECTION

• Main Authors: FURUMI TADASHI, OGUMA JUNJI, OKUNO TOSHIO, NAGASHIMA MASATOMO
• Format: Patent
• Language: English
• Published: 22.05.2002
• Edition: 7
• Subjects: DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING; FREQUENCY-CHANGING; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; NON-LINEAR OPTICS; OPTICAL ANALOGUE/DIGITAL CONVERTERS; OPTICAL LOGIC ELEMENTS; OPTICS; PHYSICS; TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF; TESTING

PROBLEM TO BE SOLVED: To provide a parallel loading unit of probe block for inspection, capable of loading or exchanging a plurality of probe blocks by inserting or withdrawing in a guide rail through a slider, adjusting position by moving (sliding) each probe block in the extension length of the guide rail, sharing a supporting base of a kind, when inserting and withdrawing probe blocks and adjusting position. SOLUTION: A plurality of probe blocks 3 for inspection, having many probes 2, are loaded in parallel on a support base 1, and the probes 2 of each probe block 3 are brought into contact with an electrode 5 of a display panel or a wiring circuit substrate 4, to inspect in the parallel loading unit of the probe block 3. A guide rail 7 is provided to the support base 1, each probe block 3 is slidably mounted on a slider 8 on the guide rail 7, and each probe block 3 for inspection is fixed to the support base 1 at a prescribed slide position in the constitution.