INTEGRATED CIRCUIT WITH PROGRAMMABLE LOGIC ANALYZER, ENHANCED ANALYZING AND DEBUGGING CAPABILITIES AND METHOD

An integrated circuit including a logic analyzer with enhanced analyzing and debugging capabilities and a method therefore. In one embodiment, an integrated circuit includes a logic analyzer having a first input receiving a plurality of signals and an output for providing an indication of a detectio...

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Bibliographic Details
Main Authors JAMES RAY BAILEY, JAMES PATRICK SHARPE, CHRISTOPHER WILSON CASE
Format Patent
LanguageChinese
English
Published 04.04.2014
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:An integrated circuit including a logic analyzer with enhanced analyzing and debugging capabilities and a method therefore. In one embodiment, an integrated circuit includes a logic analyzer having a first input receiving a plurality of signals and an output for providing an indication of a detection, by the logic analyzer, of at least one trigger event; and a built in self test block having a first input for receiving one or more of the signals appearing at the first input of the logic analyzer, a second input coupled to the output of the logic analyzer for selectively enabling the BIST block, the BIST block generating and maintaining a signature based upon the first and second inputs thereof.
Bibliography:Application Number: HK20140100362