Processing of azimuthal resistivity data in a resistivity gradient
A method for increasing sensitivity in a measurement of at least one of magnitude and direction of resistivity in a subsurface material, the method including: performing a first set of measurements of resistivity of the subsurface material using a first logging instrument; constructing a model of a...
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Format | Patent |
Language | English |
Published |
11.04.2012
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Abstract | A method for increasing sensitivity in a measurement of at least one of magnitude and direction of resistivity in a subsurface material, the method including: performing a first set of measurements of resistivity of the subsurface material using a first logging instrument; constructing a model of a background signal using the first set of measurements; calculating a predicted response of a second logging instrument to the model of the background signal; performing a second set of measurements of at least one of magnitude and direction of resistivity of the subsurface material using the second logging instrument; deriving a second logging instrument response from the second set of measurements; and subtracting the predicted response from the second logging instrument response to produce a corrected response that has greater sensitivity than the second logging instrument response. |
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AbstractList | A method for increasing sensitivity in a measurement of at least one of magnitude and direction of resistivity in a subsurface material, the method including: performing a first set of measurements of resistivity of the subsurface material using a first logging instrument; constructing a model of a background signal using the first set of measurements; calculating a predicted response of a second logging instrument to the model of the background signal; performing a second set of measurements of at least one of magnitude and direction of resistivity of the subsurface material using the second logging instrument; deriving a second logging instrument response from the second set of measurements; and subtracting the predicted response from the second logging instrument response to produce a corrected response that has greater sensitivity than the second logging instrument response. |
Author | WALLACE HAROLD MEYER JR |
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SubjectTerms | DETECTING MASSES OR OBJECTS GEOPHYSICS GRAVITATIONAL MEASUREMENTS MEASURING PHYSICS TESTING |
Title | Processing of azimuthal resistivity data in a resistivity gradient |
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