TESTING SYSTEM

• Main Authors: KAZUHIKO KIMURA, FUNIHITO INOUE, KINICHI NAKAHARA, YUICHI OHYAMA
• Format: Patent
• Language: English
• Published: 26.10.1983
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

A first signal generator and a second signal generator for setting measuring conditions of a connection pin of a device under test are disposed in each of a number of signal transmission circuits. Each of the signal generators stores therein information for setting a measuring condition in the form of a digital data, which is D-A converted, and this D-A converted output determines the measuring condition. Analog switches are disposed for selecting as a measuring condition of the connection pin either the D-A converted output of the first signal generator or that of the second signal generator. A first discriminator and a second discriminator for discriminating the quality of measured results of the connection pin of the device under test are disposed in each of the signal transmission circuits. In each of the discriminators, reference value information for discriminating the quality is stored in the form of digital data, which is D-A converted, and this D-A converted output and a measured result of the connection pin are compared with each other. A controller controls the operation of each of the signal transmission circuits.