ABNORMAL MODULATION CAUSE IDENTIFYING DEVICE, ABNORMAL MODULATION CAUSE IDENTIFYING METHOD, AND ABNORMAL MODULATION CAUSE IDENTIFYING PROGRAM

• Main Authors: MIYOSHI, Fumihiro, KOZONO, Hidetoshi, YAMANO, Koichi, OKA, Hiroki
• Format: Patent
• Language: English; French; German
• Published: 17.07.2024
• Subjects: CONTROL OR REGULATING SYSTEMS IN GENERAL; CONTROLLING; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS; PHYSICS; REGULATING

Performance to identify a cause of abnormal irregularity in a production facility is improved. An abnormal irregularity cause identifying device includes a process data acquisition unit that reads, from a storage device storing a plurality of types of pieces of process data continuously output by a plurality of sensors included in a production facility, the pieces of process data, an abnormality determination unit that calculates an abnormality degree representing an extent of an irregularity of process data of the pieces of process data read by the process data acquisition unit, and a cause diagnosis unit that obtains accuracy of a cause of the irregularity based on a proportion of process data having the abnormality degree calculated by the abnormality determination unit satisfying a predetermined criterion to the plurality of types of pieces of process data, by using causal relation information defining a combination between the cause and the irregularity, which appears as an influence resulting from the cause, of each of the plurality of types of pieces of process data.