SYSTEMS AND METHODS FOR ENHANCED WAFER MANUFACTURING

A computer device includes at least one processor in communication with at least one memory device. The at least one processor is programmed to store, in the at least one memory device, a model for simulating a portion of an assembly line and receive scan data of a first inspection of a product bein...

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Bibliographic Details
Main Author BHAGAVAT, Sumeet S
Format Patent
LanguageEnglish
French
German
Published 26.06.2024
Subjects
BASIC ELECTRIC ELEMENTS
CONTROL OR REGULATING SYSTEMS IN GENERAL
CONTROLLING
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
FUNCTIONAL ELEMENTS OF SUCH SYSTEMS
MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS
PHYSICS
REGULATING
SEMICONDUCTOR DEVICES
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Abstract A computer device includes at least one processor in communication with at least one memory device. The at least one processor is programmed to store, in the at least one memory device, a model for simulating a portion of an assembly line and receive scan data of a first inspection of a product being assembled, execute the model using the scan data as inputs to generate a final profile of the product, compare the final profile to one or more thresholds, determine if the final profile exceeds at least one of the one or more thresholds, and adjust the first device if the determination is that the final profile exceeds at least one of the one or more thresholds.
AbstractList A computer device includes at least one processor in communication with at least one memory device. The at least one processor is programmed to store, in the at least one memory device, a model for simulating a portion of an assembly line and receive scan data of a first inspection of a product being assembled, execute the model using the scan data as inputs to generate a final profile of the product, compare the final profile to one or more thresholds, determine if the final profile exceeds at least one of the one or more thresholds, and adjust the first device if the determination is that the final profile exceeds at least one of the one or more thresholds.
Author BHAGAVAT, Sumeet S
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DocumentTitleAlternate SYSTEME UND VERFAHREN ZUR VERBESSERTEN HERSTELLUNG VON WAFERN
SYSTÈMES ET PROCÉDÉS DE FABRICATION DE TRANCHES AMÉLIORÉES
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RelatedCompanies GlobalWafers Co., Ltd
RelatedCompanies_xml – name: GlobalWafers Co., Ltd
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Snippet A computer device includes at least one processor in communication with at least one memory device. The at least one processor is programmed to store, in the...
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SubjectTerms BASIC ELECTRIC ELEMENTS
CONTROL OR REGULATING SYSTEMS IN GENERAL
CONTROLLING
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
FUNCTIONAL ELEMENTS OF SUCH SYSTEMS
MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS
PHYSICS
REGULATING
SEMICONDUCTOR DEVICES
Title SYSTEMS AND METHODS FOR ENHANCED WAFER MANUFACTURING
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