MAGNETIC SENSORS

The invention provides a device (100, 200, 300) and method for determining the strength of a magnetic field normal to a two-dimensional electron gas between layers of high bandgap semiconductor material.

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Bibliographic Details
Main Authors ELWIN, Matt, FARAMEHR, Soroush, KRYUCHENKOVA, Olga, JANKOVIC, Nebojsg, IGIC, Petar
Format Patent
LanguageEnglish
French
German
Published 19.08.2020
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:The invention provides a device (100, 200, 300) and method for determining the strength of a magnetic field normal to a two-dimensional electron gas between layers of high bandgap semiconductor material.
Bibliography:Application Number: EP20170788278