GAS ANALYSIS DEVICE, PROGRAM FOR GAS ANALYSIS DEVICE, AND GAS ANALYSIS METHOD

In order to enable concentrations of components to be measured to be accurately calculated even when higher boiling compounds are contained in a test gas, a gas analysis device 100 that analyzes components to be measured that are contained in a test gas using a light spectrum obtained by irradiating...

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Bibliographic Details
Main Author TAKAHASHI, Motonobu
Format Patent
LanguageEnglish
French
German
Published 20.05.2020
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:In order to enable concentrations of components to be measured to be accurately calculated even when higher boiling compounds are contained in a test gas, a gas analysis device 100 that analyzes components to be measured that are contained in a test gas using a light spectrum obtained by irradiating light onto the test gas is provided with a calibration curve data storage section 21 in which is stored first calibration curve data in which effects on concentrations of the components to be measured from higher boiling compounds whose boiling point is higher than a heating temperature of an analyzer into which the test gas has been introduced have been corrected, and with a concentration calculation section 22 that calculates concentrations of components to be measured using the first calibration curve data.
Bibliography:Application Number: EP20180831114